Digital integrated circuit chip auxiliary test system
A technology for integrated circuits and auxiliary testing, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., which can solve the inconvenience of fast and efficient testing work, the inconvenience of automatic repair of error vector files, and reduce the progress of digital integrated circuit chip maintenance work, etc. problem, to achieve the effect of integration of detection and repair
Active Publication Date: 2020-05-29
上海春尚电子科技有限公司
View PDF11 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0004] The purpose of the present invention is to provide a digital integrated circuit chip auxiliary test system to solve the problem that the existing digital integrated circuit chip proposed in the above background technology is inconvenient to perform the test work quickly and efficiently when performing the test work. After the error vector file is found, it is not convenient to realize the automatic repair of the error vector file, which reduces the work progress of digital integrated circuit chip maintenance
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0016] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0017] see Figure 1-3 , the present invention provides a technical solution: a digital integrated circuit chip auxiliary test system, including a detection unit, an external display unit, a comparison unit, and a storage unit; the detection unit is used for temporary storage and transfer of files to be tested, And the detection unit is connected to the chip unit to be tested through the peripheral interface, and is used to output the file to be tested in the chip ...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a digital integrated circuit chip auxiliary test system in the technical field of digital integrated circuit chip detection. The digital integrated circuit chip auxiliary testsystem comprises a detection unit, an external display unit, a comparison unit and a storage unit. The detection unit is used for temporarily storing and transferring files to be detected and is connected with a chip unit to be detected through a peripheral interface and is used for outputting the files to be detected in the chip to be detected and performing file comparison and analysis in the comparison unit; the external display unit is used for displaying a comparative analysis result and deleting and re-adding an error file; the storage unit is used for storing necessary file units; the storage unit comprises an error file storage unit and a reset file storage unit, the error file storage unit is used for storing various error files. Detection and repair of the digital integrated circuit chip are integrated so that rapid maintenance work of the integrated circuit chip can be conveniently achieved.
Description
technical field [0001] The invention relates to the technical field of digital integrated circuit chip detection, in particular to an auxiliary test system for digital integrated circuit chips. Background technique [0002] The functional test mainly tests the logic function of the chip under a certain sequence. The basic principle is to apply stimulus to the chip with the help of the vector, and observe whether its response is consistent with the assumption. The functional test can cover the failure model of a very high proportion of logic circuits. No matter how complex the function of the digital integrated circuit is and how complicated the working conditions are, it can be regarded as a binary logic device. Existing digital integrated circuit chips are inconvenient to realize fast and efficient testing work when performing testing work, and after finding the error vector file, it is not convenient to realize automatic repair work to the error vector file, which reduces ...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 杨晶晶
Owner 上海春尚电子科技有限公司