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External parameter calibration device and method for structured light sensor

A technology of structured light sensor and calibration device, which is applied in the field of external parameter calibration, can solve the problems of low precision, long time consumption, complicated operation, etc., and achieves the effect of high flexibility, meeting high-precision calibration requirements, and reducing dependence.

Active Publication Date: 2021-12-03
易思维(杭州)科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the application of structured light measurement, it is not enough to obtain the coordinates of the features in the sensor coordinate system. It is also necessary to convert the three-dimensional coordinates in the sensor coordinate system to the coordinate system outside the sensor, that is, to perform external parameter calibration of the sensor. How to do it on site? Quickly and accurately obtaining the external parameters of the sensor in the application is the key technology in the sensor calibration; currently, the more common method is to use PNP to estimate the camera pose, which has low precision and cannot meet the high-precision calibration requirements of the sensor; patent 201721209036.6 - An industrial on-site quick calibration device, which proposes a quick target for on-site calibration. The target can only measure one feature point at a time during calibration, and it is necessary to place the measuring ball on different ball seats for multiple measurements. Obtaining multiple feature points is a complicated operation; in addition, during the coordinate system transformation process, the sensor needs to be removed from the fastening device, and the sensor must be reinstalled on the fastening device after calibration, which takes a long time and adds assembly Error and pin-hole fit error

Method used

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  • External parameter calibration device and method for structured light sensor
  • External parameter calibration device and method for structured light sensor
  • External parameter calibration device and method for structured light sensor

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Embodiment 1

[0039] An external parameter calibration device for a structured light sensor, comprising: a target body and a plurality of standard spheres, the plurality of standard spheres are arranged on the target body, the number is not less than four, and the centers of the standard spheres are not on the same spatial plane, The horizontal distance between the centers of two adjacent standard spheres is greater than the sum of the radii of the two standard spheres, and the vertical distance is smaller than the sum of the radii of the two standard spheres.

[0040] This setting can ensure that the contours of each ball do not overlap and the light plane can cover all standard balls at the same time;

[0041] In order to make the center of each standard ball not on the same space plane: the target body is provided with multiple planes with different heights, and the planes are distributed in steps, which rise or fall successively, or first rise and then lower, or first lower and then rise...

Embodiment 2

[0067] In this embodiment, the structured light sensor is a multi-line structured light sensor and a speckle structured light sensor as an example. The external parameter calibration device includes: a target body and a plurality of standard spheres, and a plurality of standard spheres are arranged on the target body. less than four, the centers of each standard sphere are not on the same spatial plane, the horizontal distance between the centers of two adjacent standard spheres is greater than the sum of the radii of these two standard spheres, and the vertical distance is less than the sum of the radii of these two standard spheres sum of radii.

[0068] In order to make the center of each standard ball not on the same space plane: the target body is provided with multiple planes with different heights, and the planes are distributed in steps, which rise or fall successively, or first rise and then lower, or first lower and then rise High, or irregularly distributed in heigh...

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Abstract

The invention discloses an external parameter calibration device and method for a structured light sensor. The calibration device includes: a target body and a plurality of standard spheres, the plurality of standard spheres are arranged on the target body, and the number is not less than four. The centers of each standard sphere are not on the same space plane, the horizontal distance between the centers of two adjacent standard spheres is greater than the sum of the radii of these two standard spheres, and the vertical distance is smaller than the sum of the radii of these two standard spheres; The invention also provides a method of using the calibration device to calibrate the external parameters of the structured light sensor, which has the characteristics of high flexibility and convenient use, and is suitable for the calibration of various types of structured light sensors, reducing the need for calibration of the experimental environment. Dependency, can be implemented in various industrial sites, and shorten the time of the external parameter calibration process.

Description

technical field [0001] The invention relates to the field of external parameter calibration, in particular to an external parameter calibration device and method for structured light sensors. Background technique [0002] With the development of computer vision, non-contact visual inspection and other applications are more and more widely used in scientific research and industry. Among them, the visual measurement based on line structured light has the advantages of simple structure, low cost, high efficiency and flexible use. and other advantages, it has a wide range of applications in scientific research and industry. The line structured light sensor includes a line structured light projector and a camera; Extract the feature points, and restore the feature points to the sensor coordinate system according to the principle of structured light measurement c -The three-dimensional space coordinates under XYZ, under normal circumstances, the coordinate system of the sensor is...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00
CPCG01B11/002
Inventor 郭寅尹仕斌郭磊冯伟昌孙颖
Owner 易思维(杭州)科技股份有限公司