Integrated circuit test instrument with anti-blocking function

Abstract

The invention discloses an integrated circuit test instrument with an anti-blocking function. The instrument comprises a shell, protection pads and rotating rods; a lead interface is formed in the surface of one side of the shell; the adjacent side of the lead interface is provided with a test port. The outer side of the lead interface and the outer side of the test port are provided with dustproof covers. Clamping grooves are formed in the adjacent positions, away from protruding columns, of connecting grooves and one side of the top of the shell. The protection pads are connected into the clamping grooves through clamping strips. The rotating rods are connected into disc teeth in a penetrating mode, and the ends, extending out of a gear box, of the rotating rods are connected into threaded holes in a support. According to the integrated circuit test instrument with the anti-blocking function, the dustproof covers are arranged; by rotating the dustproof covers on one side of the shell, the dustproof covers rotates through rotating shafts; and when the dustproof covers shield the positions of the lead interface and the test port on one side of the shell, the dustproof covers eliminate impurities such as external dust, thereby preventing the interface position from being blocked.

Description

technical field [0001] The invention relates to the technical field of integrated circuit instruments, in particular to an integrated circuit testing instrument with an anti-blocking function. Background technique [0002] Integrated circuit tester The tester is a special instrument for testing integrated circuits. Integrated circuit testing is one of the key means to ensure the performance and quality of integrated circuits. When producing and using integrated circuit products, corresponding integrated circuit testing instruments are required to Integrated circuit products carry out relevant circuit testing, but the leads and interfaces of integrated circuit test instruments on the market are mostly exposed, which makes integrated circuit test instruments often affected by impurities such as dust during long-term use. For this reason, our requirements for integrated circuit test instruments are getting higher and higher. It is hoped that the use efficiency of integrated cir...

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide a kind of integrated circuit testing instrument with anti-blocking function, to solve the problem that the integrated circuit testing instrument currently on the market is easily blocked by impurities such as dust, the integrated circuit testing instrument is easy to be bumped, and the integrated circuit testing instrument is easy to be bumped. The test instrument is not convenient for lead storage, the integrated circuit test instrument is not easy to carry, the integrated circuit test instrument is not convenient for leg assembly and the integrated circuit test instrument is not easy to adjust the placement angle.

Images