Circular contour detection method under condition that circular gold surface of flexible IC substrate is missing
A contour detection and substrate technology, which is applied in the field of image processing, can solve the problems that the results are difficult to fit the true value, the gray level difference becomes smaller, and the contrast is lowered, so as to overcome the incomplete contour, overcome the inaccurate contour, and reduce the influence of noise Effect
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[0047] The present invention will be further described in detail below in conjunction with the embodiments and the accompanying drawings, but the embodiments of the present invention are not limited thereto.
[0048] like figure 1 As shown, the present embodiment provides a circular profile detection method in the case of missing a circular gold surface of a flexible IC substrate, the method comprising the following steps:
[0049] S1. Obtain an image of the flexible IC substrate.
[0050] In this embodiment, an industrial CCD camera is used to collect images of the flexible IC substrate, and a white light source is selected as the light source. The copper-clad area appears golden in the image, commonly known as "golden surface", and the background appears green. When the gold surface is missing, the missing area is similar to the background, so the detection of the gold surface contour becomes difficult.
[0051] S2. Convert the image to the HSV color space, and extract the...
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