Defect layering device and method for surface defect detection

A defect detection and layering device technology, applied in measurement devices, material analysis, material analysis by optical means, etc., can solve problems such as unfavorable energy saving, general detection ability, etc., to improve structural resolution, improve perception level, The effect of improved detection capability

Active Publication Date: 2020-06-26
SHENZHEN ZVIT TECH CO LTD
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Problems solved by technology

[0003] In the prior art, there is a technical solution to solve the above problems by using a line array camera to match a linear light source. However, the structured light in the prior art is generally the same switch for the entire line, and it is mainly in the constant light mode. The detection ability is relatively general, and it is not conducive to saving power

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  • Defect layering device and method for surface defect detection
  • Defect layering device and method for surface defect detection
  • Defect layering device and method for surface defect detection

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[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and implementation examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0028] It should be noted that all directional indications (such as up, down, left, right, front, back, ...) in the embodiments of the present invention are limited to relative positions on the specified view, rather than absolute positions.

[0029] In addition, in the present invention, descriptions such as "first", "second" and so on are used for description purposes only, and should not be understood as indicating or implying their relative importance or implicitly indicating the quantity of indicated technical features. Thus, the features defined as "first" and "second" may explici...

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Abstract

The invention relates to the technical field of machine vision detection. The invention particularly relates to a defect layering device and method for surface defect detection. A linear structured light imaging system comprises a linear structured light module, a camera module, a processing unit and a display module; the linear structured light module, the camera module and the display module areconnected to the processing unit; the linear structured light module is used for emitting linear structured light to a measured object, the camera module is used for carrying out image acquisition onthe measured object under the linear structured light, and the processing unit is used for receiving image information transmitted by the camera module, carrying out data processing and outputting and displaying a final image of the measured object on the display module. Compared with the prior art, the defect layering device and method for surface defect detection have the advantages that the visual perception capability of a line scanning system can be improved by utilizing a linear structured light and camera linkage control mode, very fine surface defects which can only be seen in a specific direction can be detected, and the perception level of surface defect detection is improved.

Description

technical field [0001] The invention relates to the technical field of machine vision detection, in particular to a defect layering device and method for surface defect detection. Background technique [0002] In the design of machine vision systems, plane surface defect detection based on line-scan cameras has great commercial applications, and has broad application space in textiles, papermaking, 3C electronics, automobiles, etc. At present, with the development of society, customers' demand for product quality has risen sharply, and the demand for surface inspection has become more and more vigorous. In some industries, surface inspection has become a necessary link, but it is limited by the motion properties of linear array machine vision systems. , its detection ability along the direction of motion, when there are defects or targets parallel to the direction of motion, its detection ability will be weak. This problem has become a key problem to be solved in the surfac...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/956
CPCG01N21/01G01N21/956
Inventor 吴小飞周凯庞凤江张帆
Owner SHENZHEN ZVIT TECH CO LTD
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