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Method for automatically discovering key influence indexes

An automatic discovery and influence technology, applied in instruments, electrical digital data processing, hardware monitoring, etc., can solve problems such as false alarms, abnormal indicators, and misidentifications

Active Publication Date: 2020-07-24
南京开特信息科技有限公司
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the current technology has a common deficiency in the methods of judging whether the monitoring indicators are normal, that is, human participation is required in advance to mark their abnormal or normal values
If the pre-set value range is inaccurate, or the marked outliers are inaccurate, it will lead to false alarms or misidentification of abnormal indicators

Method used

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  • Method for automatically discovering key influence indexes
  • Method for automatically discovering key influence indexes
  • Method for automatically discovering key influence indexes

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Embodiment Construction

[0071] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0072] An embodiment of the present invention provides a method for automatically discovering key influence indicators, such as figure 1 shown, including:

[0073] Step 1: Set a specified time period for checking the target system;

[0074] Step 2: Select the influence indicators related to the target system within the specified time period, and collect and save the selected influence indicators;

[0075] Step 3: Perform pairwise correlation calculations on the collected and saved influence indicators;

[0076] Step 4: Take the absolute value of the correlation calculation result, and based on the result of taking the absolute value, sum the correlation values ​​o...

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Abstract

The invention provides a method for automatically discovering key influence indexes. The method comprises the following steps: setting a specified time period for checking a target system; selecting an influence index related to the target system in a specified time period, and collecting and storing the selected influence index; carrying out pairwise correlation calculation on the collected and stored influence indexes; taking the absolute value of the correlation calculation result, and summing the correlation values of each influence index and all the other influence indexes based on the absolute value result to obtain a comprehensive correlation value of each influence index; sorting all the obtained comprehensive correlation values from large to small, and selecting first preset N maximum comprehensive correlation values; and displaying the selected first preset N maximum comprehensive correlation values and the corresponding influence indexes. The indexes which most influence thehealth condition of the system can be automatically screened out from all the indexes without manual intervention.

Description

technical field [0001] The invention relates to the technical field of monitoring, in particular to a method for automatically discovering key influence indicators. Background technique [0002] Through the monitoring system, various technical indicators of the IT environment such as the target host, database, storage, and network can be collected in real time. Annotated abnormal features for AI-related algorithms to learn. No matter which method is used, it needs human participation in the screening of its indicators. [0003] Moreover, in terms of IT and other equipment or software system monitoring, whether the monitored indicators are abnormal, there are two ways to sum up: [0004] One is the static method, that is, when a certain value is detected to be in a certain value or in a certain value range, it is considered to be in an abnormal or unhealthy state. The setting of this value or value range is an optional setting , for example, when the CPU value is higher th...

Claims

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Application Information

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IPC IPC(8): G06F11/34
CPCG06F11/3495
Inventor 沈克勤王伟何林浩
Owner 南京开特信息科技有限公司
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