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Vibration measurement system for eliminating vibration influence of laser vibration meter base point

A laser vibrometer and vibration measurement technology, which is applied to instruments, measuring devices, and measuring ultrasonic/sonic/infrasonic waves, etc., can solve problems such as high layout requirements, limited range, and measurement errors of laser vibrometers, achieving obvious advantages, Simple and effective effects in signal processing

Active Publication Date: 2020-09-08
HOHAI UNIV
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Problems solved by technology

[0004] The purpose of the present invention is to solve the problems existing in the prior art, to provide a vibration measurement system that eliminates the influence of the vibration of the base point of the laser vibrometer, which overcomes the defects of limited range and high layout requirements of the traditional contact measurement method, and at the same time overcomes the shortcomings of using The laser vibrometer cannot rule out the defect of measurement error caused by the vibration of the laser vibrometer itself caused by the vibration of the site

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  • Vibration measurement system for eliminating vibration influence of laser vibration meter base point
  • Vibration measurement system for eliminating vibration influence of laser vibration meter base point

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[0016] The technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0017] In the description of the patent of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" The orientation or positional relationship of the other indications is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the patent of the present invention and simplifying the description, rather than indicating or imply...

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Abstract

The invention discloses a vibration measurement system for eliminating the vibration influence of laser vibration meter base points, and the system comprises two laser vibration meters, a symmetric reflection box, a signal amplifier, a data collector, and a processor, wherein the symmetric reflection box consists of six reflectors and a rigid reflection plate. According to the invention, a more accurate measurement mode can be provided for vibration measurement; forward and reverse tracking of the same target point is carried out through the two laser vibration meters at the same position andthe corresponding optical elements; the influence of vibration of a base point of the laser vibration meter can be eliminated, an absolute vibration signal of a measured object is obtained, and the defect that the vibration influence of the laser vibration meter caused by field vibration cannot be eliminated in a traditional direct measurement mode of the laser vibration meter is overcome.

Description

Technical field [0001] The invention belongs to the technical field of laser vibration measurement, in particular to a vibration measurement system that eliminates the influence of the vibration of the fundamental point of a laser vibrometer. Background technique [0002] Vibration and noise often bring a lot of trouble to people's lives. In the machinery industry or construction industry, excessive vibration can even bring safety hazards. Therefore, the measurement and analysis of vibration is particularly important for the study of object vibration. The traditional contact measurement method is to arrange a number of sensors on the measured object, and through the close contact between the sensor and the measured object, the vibration signal of the measured object is collected and analyzed. However, the contact measurement method also has some disadvantages. For example, the installation requirements are high, the sensor must be firmly fixed on the object to be measured, and so...

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Application Information

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IPC IPC(8): G01H9/00
CPCG01H9/00
Inventor 孙立国肖浩东叶飞翔赵伟明索博雅张兴龙
Owner HOHAI UNIV
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