Micron-sized particle sample automatic searching and positioning device and method

A technology for automatically finding and locating devices, applied to measuring devices, material analysis through optical means, instruments, etc., can solve problems such as complex processes and low efficiency, achieve the effect of simplifying complex structures and processes, and improving detection efficiency

Pending Publication Date: 2020-09-22
CHANGZHOU INST OF ADVANCED MFG TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing instruments for measuring the mechanical properties of micro-particles are either manually operated in terms of sample search and selection, or semi-offline automatic detection is performed through a multi-angle image system, which is inefficient and complicated.

Method used

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  • Micron-sized particle sample automatic searching and positioning device and method
  • Micron-sized particle sample automatic searching and positioning device and method
  • Micron-sized particle sample automatic searching and positioning device and method

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Embodiment Construction

[0034] see figure 1 In this embodiment, the automatic search and positioning device for micron-sized particle samples includes: a single-channel video microscope unit 1, a digital image processing unit 2, a multi-dimensional electronically controlled displacement stage 3 and a programmable electronically controlled displacement drive unit 4 for Automatically find suitable micro-particle samples, in order to cooperate with other modules on the main test instrument to test the required properties of the found micro-particle samples.

[0035] In the present embodiment, the single-channel video microscope unit 1 has a digital video image output part, which is used to observe images of samples that may exist on the surface of the sample slide 11 with a side view angle; and output image data by the digital video image output part; It is a real-time video image sequence; the side view angle refers to the optical axis of the single-channel video micro unit 1 perpendicular to the strai...

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Abstract

The invention discloses a micron-sized particle sample automatic searching and positioning device and a micron-sized particle sample automatic searching and positioning method. The device comprises asingle-channel video microscopic unit, a digital image processing unit, a multi-dimensional electric control displacement platform deck and a programmable electric control displacement driving unit, and is used for automatically searching a proper micro-particle sample so as to be matched with other modules on a main test instrument to test the required performance of the searched micro-particle sample. According to the automatic searching and positioning method for the micron-sized particle sample, scanning type automatic sample searching is achieved along the traversal path, online real-timemeasurement is carried out in the mode that measurement is carried out immediately after searching and searching continues after measurement is completed, and the detection efficiency is greatly improved.

Description

technical field [0001] The invention relates to the field of microscopic measurement technology, and more specifically relates to an automatic searching and positioning device for micron-sized particle samples, which is used for searching and locating micron-sized particle samples, and is used for performing corresponding sample performance tests with a main testing instrument. Background technique [0002] With the development of nanomaterials science, various materials and products in the form of micron-sized particles are emerging. The mechanical properties data of microparticles have a decisive influence on the production process and use. Existing instruments for measuring the mechanical properties of micro-particles are either manually operated for sample search and selection, or semi-offline automatic detection is performed through a multi-angle image system, which is inefficient and complicated. Contents of the invention [0003] In order to avoid the shortcomings ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/00G01N21/84G01N21/88G01N21/95
CPCG01N15/00G01N21/84G01N21/8851G01N21/95
Inventor 张志兵孙鹏张志华李华峰叶晓东王容川刘东汪志焕孔令成
Owner CHANGZHOU INST OF ADVANCED MFG TECH
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