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A chip regression testing method, system, electronic equipment and storage medium

A regression test and chip technology, applied in the computer field, can solve the problems of poor readability, maintainability and versatility, low efficiency of chip regression test, etc., and achieve the effect of improving efficiency

Active Publication Date: 2022-03-22
SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In related technologies, chip regression testing operations all rely on scripting language to manage huge test cases, but this way of directly using scripting language to manage test cases is poor in readability, maintainability and versatility, and the efficiency of chip regression testing is low. Low

Method used

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  • A chip regression testing method, system, electronic equipment and storage medium
  • A chip regression testing method, system, electronic equipment and storage medium
  • A chip regression testing method, system, electronic equipment and storage medium

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Embodiment Construction

[0043] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0044] see below figure 1 , figure 1 It is a flow chart of a chip regression testing method provided by the embodiment of the present application.

[0045] Specific steps can include:

[0046] S101: Receive a parameter setting instruction, and set the attribute information of the test case in the structural verification plan file according to the p...

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Abstract

The present application discloses a chip regression testing method. The chip regression testing method includes receiving a parameter setting instruction, and setting the attribute information of the test case in the structure verification plan file according to the parameter setting instruction; constructing the structure verification plan file corresponding to The data structure of the test case, and the attribute information of the test case is stored in the data structure; the simulation configuration file corresponding to the test case is generated according to the test case and the data structure, and the simulation configuration file corresponding to the simulation configuration file is generated Shell script; performing a simulation operation by running the Shell script to obtain a simulation log, and generating a chip regression test result according to the simulation log. The application can improve the efficiency of chip regression testing. The application also discloses a chip regression testing system, a storage medium and an electronic device, which have the above beneficial effects.

Description

technical field [0001] The present application relates to the field of computer technology, in particular to a chip regression testing method and system, an electronic device and a storage medium. Background technique [0002] The chip verification process is very important to ensure the quality of chip design. The usual practice is to develop a large number of direct test cases and random test cases to cover all function points as much as possible. With the continuous improvement of chip scale, in order to implement verification more efficiently, most companies will divide the chip into modules, perform detailed verification on each module, and verify system-level test cases at the entire chip level. In order to ensure the convergence of the verification results, regression testing is often required. The so-called regression testing refers to re-testing regardless of any old codes modified in the design, or some changes in the working environment, to confirm that the modifi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/33G06F8/71
CPCG06F30/33G06F8/71
Inventor 田利波邵海波乐亚平贾晓龙季进峰
Owner SHANDONG YUNHAI GUOCHUANG CLOUD COMPUTING EQUIP IND INNOVATION CENT CO LTD
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