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Integrate test methods, platforms and systems

A test platform and test piece technology, applied in the field of integration test, platform and system, can solve the problems of limited space on board, inability to meet the needs of integration test, and the cost of not building an aircraft-level system integration test platform.

Active Publication Date: 2021-09-07
COMAC +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is no cost-effective solution for building an aircraft-level system integration test platform for aircraft-level system integration testing
[0003] For example, when considering the aircraft-level system integration test, if all the subsystem test platforms are built in a centralized manner, it will occupy a huge area, and the centralized physical placement of the test equipment will affect the use of connections, which cannot meet the requirements of the integration test, and the subsystem test Requirements basically completely consume test bench resources
[0004] In addition, at present, aircraft-level system integration tests are generally arranged on the aircraft, but due to the limited space on the aircraft, it is difficult to modify and monitor the test, which has a great impact on the test troubleshooting and test progress.

Method used

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  • Integrate test methods, platforms and systems
  • Integrate test methods, platforms and systems
  • Integrate test methods, platforms and systems

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Embodiment Construction

[0038] In an integrated test, multiple test platforms are usually involved, which are generally referred to as subsystem test platforms. For example, when involving aircraft-level system integration testing, it may involve testbeds for various subsystems of an aircraft (such as a civil aircraft), such as avionics system testbeds, power subsystem testbeds, power subsystem testbeds, and the like. These subsystem testbeds may have various test pieces that need to be tested or tested, such as power switch test pieces for power subsystems, engine control unit test pieces for power subsystems, and / or those included in the cockpit of avionics systems. Individual test pieces (such as displays, throttle sticks, etc.), and so on.

[0039] In an example of the present disclosure, these test pieces may be located in different subsystem test platforms, and these subsystem test platforms may be located remotely from each other, so that these subsystem test platforms need to be organically i...

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Abstract

The present disclosure relates to a method for stimulating at least one of one or more destination test pieces at a destination subsystem test platform including the one or more destination test pieces, the method comprising: receiving a data frame from one or more source subsystem test benches, the data frame including at least a destination test piece identifier field and a data field, and wherein the data field includes at least a transmission signal of the at least one of the test pieces; parsing the data frame to obtain a test piece identifier and the transmission signal; and transmitting the transmission signal to one of the one or more destination test pieces The destination test piece corresponding to the test piece identifier is used to stimulate the destination test piece to perform corresponding operations.

Description

technical field [0001] The present disclosure relates to integrated testing methods and systems. Background technique [0002] Currently, the development of various systems involves integration experiments at various levels. For example, in the research and development of aircraft (eg, civil aircraft, military aircraft, etc.) systems, each aircraft subsystem is integrated and configured with a corresponding subsystem test platform to complete the integration test. However, at the time of aircraft-level system integration testing, there is no cost-effective solution for building an aircraft-level system integration test bed. [0003] For example, when considering the aircraft-level system integration test, if all the subsystem test platforms are built in a centralized manner, the area will be huge, and the centralized physical placement of the test equipment will affect the use of connections, which cannot meet the integration test requirements, and the subsystem test The d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M99/00B64F5/60
CPCB64F5/60G01M99/00
Inventor 王鸿鑫郭晓燕沈天伦高斌吴晨汪亚杰
Owner COMAC