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Device and method for quickly measuring electric field noise on metal surface
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A metal surface and electric field technology, which is applied in the direction of measuring devices, measuring device shells, measuring electricity, etc., can solve the problems of high requirements, long detection period of electric field noise on the surface of the sample to be tested, and the inability to quickly replace the metal sample to be tested. The noise is fast and the effect of reducing the difficulty of measurement manipulation
Active Publication Date: 2022-05-03
INNOVATION ACAD FOR PRECISION MEASUREMENT SCI & TECH CAS
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Problems solved by technology
The disadvantage is that the metal sample to be tested cannot be replaced quickly in the high vacuum environment of the vacuum chamber, and the method for detecting the electric field noise on the metal surface also has high requirements on experimental conditions, and the detection cycle of the electric field noise on the surface of the sample to be tested is relatively long
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Embodiment 1
[0046] A device for quickly measuring the electric field noise on the metal surface, including a vacuum chamber 12, a CCD camera 10, a first vacuum angle valve 13, an ion pump 14, a vacuum baffle valve 16, a first three-way vacuum connector 17, and a second vacuum angle valve 34 , three-dimensional driver 18, three-dimensional nano mobile platform 20 and sample holder 24 to be tested, also comprise the chip support frame 21 that is arranged in the vacuum chamber, the chip support frame 21 is provided with calcium atomic furnace 22 and filter circuit board 26, filter circuit board An ion trap chip 25 is arranged in the chip placement hole of 26, and a light-through window is arranged on the vacuum cavity.
[0047] The above-mentioned ion trap chip 25 includes 15 DC electrodes and 2 RF electrodes, and the ion trap chip 25 can adopt the existing ion trap chip 25 . The filter circuit board 26 is provided with a filter circuit and a radio frequency wire, and the DC electrode is con...
Embodiment 2
[0070] At this moment, the metal sample 27 to be tested has been driven by the one-dimensional driver 32 to the trapped trapped ions ( 40 Ca + ion) above 28 Figure 4b location shown.
[0071] Such as Figure 6a shown. After the ions are cooled to the Doppler limit, turn off the cooling laser to let the ions heat up for a certain period of time, then turn on the cooling laser and quickly use the CCD camera to capture the image of the ions.
[0072] Such as Figure 6b shown. The image after Gaussian function fitting represents the probability distribution of ions at different positions on the two-dimensional plane, and the temperature of the ions can be known.
[0073] Such as Figure 7 shown.
[0074] A method for quickly measuring electric field noise on a metal surface, comprising the following steps:
[0075] Step 1: Apply electricity to the calcium atom furnace 22 to make the calcium atoms diffuse to the surface of the ion trap chip 25 .
[0076] Step 2, 423nm ph...
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Abstract
The invention discloses a device for quickly measuring the electric field noise of a metal surface, comprising a vacuum chamber, a CCD camera, a first vacuum angle valve, an ion pump, a vacuum baffle valve, a three-way vacuum connector, a second vacuum angle valve, a three-dimensional driver, a three-dimensional The nano mobile platform and the sample rack to be tested also include a chip support frame arranged in the vacuum chamber. The chip support frame is provided with a calcium atom furnace and a filter circuit board, and an ion trap chip is provided in the chip placement hole of the filter circuit board. The invention also discloses a method for quickly measuring the electric field noise on the metal surface, including ion trapping and laser cooling, manipulation of ion quantum states, ion imaging and data processing through a CCD camera. The invention can quickly replace the metal sample to be tested without destroying the vacuum of the ion trap; at the same time, it provides a simpler and faster method to detect the metal sample to be tested by using ion imaging of a CCD camera while reducing the difficulty of measurement manipulation. Surface electric field noise.
Description
technical field [0001] The invention relates to the technical field of metal surface electric field noise detection, in particular to a device for quickly measuring metal surface electric field noise, and also to a method for quickly measuring metal surface electric field noise, which is suitable for the detection of metal surface electric field noise. Background technique [0002] Ions trapped in ion traps are very sensitive to electric field noise generated by the metal surface, which causes heating of the ions due to their motion. Ions trapped in a vacuum environment will not be disturbed by the external environment, and their vibrational quantum states and electron spins can be precisely manipulated by lasers, and the ion heating rate can be accurately measured, thereby realizing the measurement of the electric field noise on the metal surface. [0003] Conventional metal surface electric field noise detection devices need to fix the sample to be tested at a certain dist...
Claims
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Application Information
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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/26G01R1/02G01R1/04
CPCG01R29/26G01R1/02G01R1/04
Inventor 陈亮张航魏雅琪刘志超李冀冯芒
Owner INNOVATION ACAD FOR PRECISION MEASUREMENT SCI & TECH CAS
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