Weak fault feature extraction method based on selective integration and improved local feature decomposition
A technology of fault characteristics and local characteristics, applied in the testing of computer components and mechanical components, and the recognition of patterns in signals, etc., can solve problems such as pattern confusion
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[0066] Embodiments of the invention are described in detail below, examples of which are illustrated in the accompanying drawings. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.
[0067] The present invention proposes an improved local characteristic scale decomposition method of integrated selection. Firstly, the improvement of LCD mainly includes boundary extension and the selection envelope interpolation mean curve of integrated selection learning, so as to realize the effectiveness of LCD for decomposition of different complex signals. ; and then adopt the proposed AWOGS and minmax adaptive denoising strategy to denoise the decomposed single-component ISCs. details as follows:
[0068] 1. LCD boundary extension
[0069] Boundary extension needs to reflect the overall trend of the data at both ends, in order to eliminate component distortion ...
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