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Method and system for testing single-chip microcomputer program

A test method and test system technology, applied in software test/debugging, error detection/correction, instruments, etc., can solve problems such as difficulty in single-chip software unit testing, and achieve the effect of simple and easy testing

Pending Publication Date: 2021-01-22
QINGDAO HAIER AIR CONDITIONER GENERAL CORP LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Due to the differences and quantity of MCU manufacturers and core types, there are many compiler models, which makes the unit testing of MCU software very difficult.
At present, there are few tools and methods for testing single-chip software, and most of them are tested on the PC side for portable programs.

Method used

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  • Method and system for testing single-chip microcomputer program
  • Method and system for testing single-chip microcomputer program
  • Method and system for testing single-chip microcomputer program

Examples

Experimental program
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Embodiment Construction

[0024] This embodiment firstly provides a single-chip program testing method, which is suitable for various types of single-chip program testing methods, making the single-chip program testing simple and easy. figure 1 is a schematic diagram of a testing method for a single-chip microcomputer program according to an embodiment of the present invention. Such as figure 1 Shown, the testing method of this one-chip computer program can carry out the following steps:

[0025] Step S102, obtaining pre-generated test cases and test programs generated according to the test cases;

[0026] Step S104, obtaining a single-chip microcomputer programmed with a test program;

[0027] Step S106, sending the test case to the single-chip microcomputer through the host computer, and judging whether the logic of the test program is correct according to the data returned by the single-chip microcomputer.

[0028] In the above steps, the step of obtaining pre-generated test cases in step S102 ma...

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PUM

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Abstract

The invention provides a method and a system for testing a single-chip microcomputer program. The method comprises the steps of obtaining a pre-generated test case and a test program generated according to the test case; obtaining a single-chip microcomputer programmed with a test program; and sending the test case to the single-chip microcomputer through the upper computer, and judging whether the logic of the test program is correct or not according to the data returned by the single-chip microcomputer. According to the scheme provided by the invention, a program test method suitable for various single-chip microcomputer types and an independent test system platform are provided, so that the single-chip microcomputer program test is simple, convenient and feasible; the coverage test casecan be automatically generated only by editing the input parameter name, the parameter value range and the parameter step length, the editing workload of the test case is reduced, and the effect of the test case is easy to understand.

Description

technical field [0001] The invention relates to the technical field of single-chip microcomputers, in particular to a method and system for testing programs of single-chip microcomputers. Background technique [0002] Due to the difference and number of manufacturers and core types of single-chip microcomputers, there are many compiler models, which makes unit testing of single-chip microcomputer software very difficult. At present, there are few tools and methods for testing single-chip software, and most of them are tested on the PC side for portable programs. Contents of the invention [0003] An object of the present invention is to provide a program testing method suitable for various types of single-chip microcomputers, so that the program testing of the single-chip microcomputers is simple and easy. [0004] A further object of the present invention is to reduce the workload of editing test cases. [0005] In particular, the present invention provides a method for...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3676G06F11/3684G06F11/3692
Inventor 徐勤耀董金盛高保华房亮贤扬曹壬艳李相军
Owner QINGDAO HAIER AIR CONDITIONER GENERAL CORP LTD
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