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Debugging information acquisition method and device, electronic equipment and storage medium

Active Publication Date: 2021-01-26
湖北芯擎科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The embodiment of the present application provides a debugging information acquisition method, device, electronic equipment, and storage medium to alleviate the existing technical problem that the debugging information output is not smooth during the chip debugging process

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  • Debugging information acquisition method and device, electronic equipment and storage medium
  • Debugging information acquisition method and device, electronic equipment and storage medium
  • Debugging information acquisition method and device, electronic equipment and storage medium

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Embodiment Construction

[0033] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Apparently, the described embodiments are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of this application.

[0034] It should be noted that the terms "first", "second", "third", "fourth", etc. (if any) in this application are used to distinguish similar objects, not necessarily to describe a specific order or priority. It is to be understood that the data so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein can be practiced in sequences other than those illustrated or described herein. Furthermore, the terms "comprisin...

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Abstract

The invention provides a debugging information acquisition method and device, electronic equipment and a storage medium, and the method comprises the steps: receiving to-be-displayed debugging information through a debugging queue, and generating a first enable signal according to the to-be-displayed debugging information; receiving a first enable signal through a trigger component, and generatinga trigger signal according to the first enable signal; when the trigger signal is detected, obtaining to-be-displayed debugging information from the debugging queue, and storing the to-be-displayed debugging information into the cache component; and finally, loading the debugging information to be displayed from the cache component and displaying the debugging information. By changing the triggering condition, the triggering signal is generated only when the debugging queue receives the to-be-displayed information, so that the debugging information does not need to be acquired frequently, resources are saved, it can be guaranteed that the to-be-displayed debugging information can be acquired after the triggering signal is generated each time, that is, effective debugging information can be acquired each time, and therefore, the display output is smooth, and the debugging efficiency of research and development personnel is further improved.

Description

technical field [0001] The present application relates to the technical field of chip verification, and in particular to a debugging information acquisition method, device, electronic equipment and storage medium. Background technique [0002] Chip verification through the EMU platform can greatly improve the simulation efficiency, so it is widely used in verifying extremely large-scale chip designs. The relevant debugging information of the chip during debugging is output and displayed through the EMU platform, and the display speed of the debugging signals directly affects It affects the debugging efficiency of R&D personnel. At present, when obtaining the debugging signal, the high-frequency clock signal is used as the trigger condition to complete the capture of the output debugging information. However, the pulse of the clock signal is too frequent, and the acquisition operation of the debugging signal must be performed when each pulse of the clock signal is generated. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26
CPCG06F11/26
Inventor 于永庆周海靳慧杰金正雄
Owner 湖北芯擎科技有限公司