A DC voltage drop analysis method and system for a system-level integrated circuit

Abstract

The invention discloses a direct current voltage drop analysis method and system of a system-level integrated circuit. The method first divides the system-level integrated circuit into a plurality of subsystems, and when analyzing the mth subsystem, analyzes the mth subsystem. All subsystems outside are regarded as a system to be processed; the field of each subsystem is meshed, and the points where the external circuits of the subsystem and the vias of other subsystems are connected to the field are added to the meshing node, the meshing nodes are uniformly numbered to form a unified finite element sparse matrix; the star-triangle transformation method is used to eliminate the internal nodes of the system to be processed in the finite element sparse matrix, and the sparse matrix for analyzing the mth subsystem field is obtained, Only the mth subsystem is solved instead of the sparse matrix of the entire system field, which greatly simplifies the solution process. On the basis of ensuring the solution accuracy, the solution speed is improved, and the DC voltage drop of the system-level VLSI is realized. Perform fast and accurate analysis.

Description

technical field [0001] The invention relates to the technical field of system-level integrated circuit analysis, in particular to a method and system for analyzing DC voltage drop of system-level integrated circuits. Background technique [0002] The DC voltage drop analysis of system-level VLSI is an important task in the back-end verification of integrated circuits. In the design process of the current system-level VLSI, the core power supply voltage of the devices in the integrated circuit continues to decrease, and the tolerance of the allowable voltage is getting smaller and smaller, but the operating current and wiring density of the integrated circuit are getting larger and larger. As a result, the DC voltage drop problem has become increasingly prominent. If the DC voltage drop problem is not considered in the design process of the system-level VLSI, it is likely that the noise margin of the system will decrease due to the DC voltage drop problem, and a small distur...

AI Technical Summary

Problems solved by technology

For system-level VLSI with multi-scale structure, high-quality meshing is performed on the area where the entire system-level VLSI is located, and the number of meshing nodes generated will reach tens of millions or even hundreds of millions It is difficult to directly solve the finite element sparse matrix with tens of millions or even hundreds of millions of unknowns formed by the grid. Even if it can be solved, it will require huge memory and CPU time. For the design of system-level VLSI Therefore, how to provide a high-precision and fast solution method to quickly and accurately analyze the DC voltage drop of system-level VLSI has become an urgent technical problem to be solved.

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