Direct-current voltage drop analysis method and system for system-level integrated circuit

Abstract

The invention discloses a Direct-current voltage drop analysis method and a system for a system-level integrated circuit, and the method comprises the steps: dividing the system-level integrated circuit into a plurality of subsystems, and enabling all subsystems except the mth subsystem to serve as a to-be-processed system when the mth subsystem is analyzed; carrying out mesh generation on the field domain of each subsystem, adding points, connected with the field domain, of an external circuit of the subsystem and via holes of other subsystems into mesh generation nodes, and numbering the mesh generation nodes in a unified manner to form a unified finite element sparse matrix; eliminating the internal nodes of a to-be-processed system in a finite element sparse matrix by adopting a star triangle transformation method, obtaining a sparse matrix for analyzing the field domain of the mth subsystem, and only solving the sparse matrix of the field domain of the mth subsystem rather than the whole system so that the solving process is greatly simplified, the solving speed is increased on the basis of ensuring the solving precision, the solving efficiency is improved, and rapid and accurate analysis of the DC voltage drop of the system-level super-large-scale integrated circuit is realized.

Description

technical field [0001] The invention relates to the technical field of system-level integrated circuit analysis, in particular to a method and system for analyzing DC voltage drop of system-level integrated circuits. Background technique [0002] The DC voltage drop analysis of system-level VLSI is an important task in the back-end verification of integrated circuits. In the design process of the current system-level VLSI, the core power supply voltage of the devices in the integrated circuit continues to decrease, and the tolerance of the allowable voltage is getting smaller and smaller, but the operating current and wiring density of the integrated circuit are getting larger and larger. As a result, the DC voltage drop problem has become increasingly prominent. If the DC voltage drop problem is not considered in the design process of the system-level VLSI, it is likely that the noise margin of the system will decrease due to the DC voltage drop problem, and a small distur...

AI Technical Summary

Problems solved by technology

For system-level VLSI with multi-scale structure, high-quality meshing is performed on the area where the entire system-level VLSI is located, and the number of meshing nodes generated will reach tens of millions or even hundreds of millions It is difficult to directly solve the finite element sparse matrix with tens of millions or even hundreds of millions of unknowns formed by the grid. Even if it can be solved, it will require huge memory and CPU time. For the design of system-level VLSI Therefore, how to provide a high-precision and fast solution method to quickly and accurately analyze the DC voltage drop of system-level VLSI has become an urgent technical problem to be solved.

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