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Defect detection method and device

A defect detection and defect technology, used in still image data retrieval, image data processing, special data processing applications, etc., can solve problems such as data inaccuracy, and achieve the effect of reducing data inaccuracy.

Inactive Publication Date: 2021-02-12
CHANGZHOU MICROINTELLIGENCE CO LTD
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  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

[0003] In order to solve the above technical problems, the present invention provides a defect detection method, which can meet the acquisition of defect data in complex business scenarios, and greatly reduces the problem of inaccurate data caused by various coordinate errors in the data labeling process

Method used

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0020] figure 1 It is a flowchart of a defect detection method according to an embodiment of the present invention.

[0021] Such as figure 1 As shown, the defect detection method in the embodiment of the present invention may include the following steps:

[0022] S1, acquiring a product image, and converting the product image into a vector diagram.

[0023] According to an embodiment of the present invention, the product image is converted into a vector im...

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Abstract

The invention provides a defect detection method and device, and the method comprises the following steps: obtaining a product image, and converting the product image into a vector diagram; obtainingposition parameters of the vector diagram, the position parameters including one or more of size, pixel and coordinate; and processing the vector diagram according to the position parameters of the vector diagram to obtain a defect contour. According to the defect detection method, acquisition of defect data in a complex business scene can be met, and the problem of data inaccuracy caused by various coordinate errors in the data labeling process is greatly reduced.

Description

technical field [0001] The present invention relates to the technical field of defect detection, in particular to a defect detection method, a defect detection device, a computer device and a non-transitory computer-readable storage medium. Background technique [0002] Since there are various defective product images in current business scenarios, and the acquisition of defect data is becoming more and more complicated, this makes labeling not only time-consuming and laborious, but also the labeling results are inaccurate. Contents of the invention [0003] In order to solve the above technical problems, the present invention provides a defect detection method, which can meet the acquisition of defect data in complex business scenarios, and greatly reduces the problem of data inaccuracy caused by various coordinate errors in the data labeling process. [0004] The technical scheme that the present invention adopts is as follows: [0005] A defect detection method, compri...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/181G06T3/40G06T7/62G06F16/56
CPCG06T7/0002G06T7/181G06T3/40G06T7/62G06F16/56
Inventor 孙猛猛纪旭宇郭宁韩锦潘正颐侯大为
Owner CHANGZHOU MICROINTELLIGENCE CO LTD
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