Asynchronous test method and system based on multiple virtual PCIE cards

Abstract

The invention provides an asynchronous test method and system based on multiple virtual PCIE cards. The method comprises the steps of inserting at least one physical PCIE card into a test host througha physical interface, and a plurality of virtual machines are installed on the test host; virtualizing a single physical PCIE card into a plurality of virtual PCIE cards through an SR-IOV technology,and constructing a virtual channel between each virtual PCIE card and the virtual machine; enabling the test application to scan all the virtual PCIE cards on all the virtual machines and start a plurality of test processes; under each test process, starting a virtual PCIE card configuration space monitoring thread; starting a plurality of DMA test thread groups and BAR test thread groups by eachtest process, and asynchronously testing the data processing accuracy of each DMA high-speed channel and each BAR low-speed channel; and for each virtual PCIE card, if a test thread group exceeding apreset threshold feeds back a data processing error of the DMA high-speed channel or the BAR low-speed channel, judging that the data processing performance of the virtual PCIE card is unqualified, and otherwise, judging that the performance is qualified.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an asynchronous testing method and system based on multiple virtual PCIE cards. Background technique [0002] With the development of modern social science and technology, PCIE bus is widely used in computer systems as a high-performance I / O bus. SR-IOV (Single-Root I / O Virtualization, single root I / O virtualization) is a standard introduced by PCI-SIG, which defines a standard mechanism of PCIE device virtualization technology, which is a part of "virtual channel". A technical implementation for virtualizing a PCIE device into multiple PCIE devices, and each virtual PCIE device provides services to upper-layer software just like a physical PCIE device. [0003] At present, PCIE devices need to be tested for performance after development is completed. Traditional testing methods (such as the PCIe card testing device and method disclosed in patent document CN 110837445 A) can on...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem that the traditional PCIE card testing method cannot realize synchronous performance testing of multiple virtual PCIE devices in the PCIE device, the present invention provides an asynchronous testing method and system based on multiple virtual PCIE cards

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