A kind of asynchronous test method and system based on multiple virtual PCIe cards

A technology of asynchronous testing and virtual machine, which is applied in the field of testing to achieve the effect of improving testing efficiency and testing comprehensiveness, improving testing efficiency and wide applicability

Active Publication Date: 2022-02-11
ZHENGZHOU XINDA JIEAN INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem that the traditional PCIE card testing method cannot realize synchronous performance testing of multiple virtual PCIE devices in the PCIE device, the present invention provides an asynchronous testing method and system based on multiple virtual PCIE cards

Method used

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  • A kind of asynchronous test method and system based on multiple virtual PCIe cards
  • A kind of asynchronous test method and system based on multiple virtual PCIe cards

Examples

Experimental program
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Effect test

Embodiment 1

[0053] Such as figure 1 As shown, the embodiment of the present invention provides a kind of asynchronous testing method based on a plurality of virtual PCIE cards, and described method comprises the following steps:

[0054] S101: Plug at least one physical PCIE card into a test host through a physical interface, wherein multiple virtual machines are installed on the test host;

[0055] S102: Virtualize a single physical PCIE card into multiple virtual PCIE cards through SR-IOV technology, and construct a virtual channel for data transmission between each virtual PCIE card and the corresponding virtual machine, each virtual PCIE card includes multiple DMA high-speed channel, multiple BAR low-speed channels and configuration space, the configuration space is used to store virtual PCIE card identification information, the number of DMA high-speed channels, the number of BAR low-speed channels;

[0056] S103: The test application of the test host scans all virtual PCIE cards co...

Embodiment 2

[0063] On the basis of the above-mentioned embodiment 1, the difference between the embodiment of the present invention and the above-mentioned embodiment is that this embodiment further optimizes the test process in step S106, and each DMA test thread group includes A DMA sending thread for channel sending test data and a DMA receiving thread for receiving response data, each BAR test thread group includes a BAR sending thread for sending test data to the BAR low-speed channel and a BAR receiving thread for receiving response data, Specifically:

[0064] S1061: The DMA sending thread sends the DMA test data to the corresponding DMA high-speed channel, and the BAR sending thread sends the BAR test data to the corresponding BAR low-speed channel;

[0065] S1062: After the corresponding DMA high-speed channel receives the DMA test data and performs transparent transmission or processing, returns the DMA response data to the corresponding DMA receiving thread; at the same time, t...

Embodiment 3

[0068] In order to test the limit speed of each virtual PCIE card, the embodiment of the present invention also provides a kind of asynchronous testing method based on a plurality of virtual PCIE cards, and the difference from each of the above-mentioned embodiments is that the present embodiment also includes the following steps:

[0069] S108: After the data processing performance of the virtual PCIE card is determined to be qualified, test the limit speed of each DMA high-speed channel through each DMA test thread group corresponding to the test process, and test the speed limit of each BAR low-speed channel through each BAR test thread group limit speed.

[0070] As a kind of implementable mode, the limit speed of each DMA high-speed channel is tested respectively by each DMA test thread group corresponding to the test process, specifically including:

[0071] S1081: The DMA sending thread repeatedly sends DMA test data to the corresponding DMA high-speed channel according...

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Abstract

The invention provides an asynchronous testing method and system based on multiple virtual PCIE cards. The method comprises: inserting at least one physical PCIE card on the test host through a physical interface respectively, and multiple virtual machines are installed on the test host; virtualizing a single physical PCIE card into multiple virtual PCIE cards by SR-IOV technology, and Build a virtual channel between each virtual PCIE card and the virtual machine; the test application scans all the virtual PCIE cards on each virtual machine, and starts multiple test processes; under each test process, starts the virtual PCIE card configuration space monitoring thread; Each test process starts multiple DMA test thread groups and BAR test thread groups to asynchronously test the data processing accuracy of each DMA high-speed channel and each BAR low-speed channel; for each virtual PCIE card, if there are test threads exceeding the preset threshold When the group feedbacks the DMA high-speed channel or the BAR low-speed channel to process data errors, it is determined that the data processing performance of the virtual PCIE card is unqualified, otherwise, the performance is qualified.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an asynchronous testing method and system based on multiple virtual PCIE cards. Background technique [0002] With the development of science and technology in modern society, PCIE bus is widely used in computer systems as a high-performance I / O bus. SR-IOV (Single-Root I / O Virtualization, single-root I / O virtualization) is a standard introduced by PCI-SIG, which defines a standard mechanism of PCIE device virtualization technology and is a part of "virtual channel". This technology is used to virtualize one PCIE device into multiple PCIE devices, and each virtual PCIE device provides services for the upper layer software just like a physical PCIE device. [0003] Currently, PCIE devices need to be tested for performance after development. Traditional testing methods (such as the PCIe card testing device and method disclosed in patent document CN 110837445 A) can only test the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
CPCG06F11/2221G06F11/2273
Inventor 王斌王中原吴世勇冯驰李银龙卫志刚
Owner ZHENGZHOU XINDA JIEAN INFORMATION TECH
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