A kind of asynchronous test method and system based on multiple virtual PCIe cards

Abstract

The invention provides an asynchronous testing method and system based on multiple virtual PCIE cards. The method comprises: inserting at least one physical PCIE card on the test host through a physical interface respectively, and multiple virtual machines are installed on the test host; virtualizing a single physical PCIE card into multiple virtual PCIE cards by SR-IOV technology, and Build a virtual channel between each virtual PCIE card and the virtual machine; the test application scans all the virtual PCIE cards on each virtual machine, and starts multiple test processes; under each test process, starts the virtual PCIE card configuration space monitoring thread; Each test process starts multiple DMA test thread groups and BAR test thread groups to asynchronously test the data processing accuracy of each DMA high-speed channel and each BAR low-speed channel; for each virtual PCIE card, if there are test threads exceeding the preset threshold When the group feedbacks the DMA high-speed channel or the BAR low-speed channel to process data errors, it is determined that the data processing performance of the virtual PCIE card is unqualified, otherwise, the performance is qualified.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an asynchronous testing method and system based on multiple virtual PCIE cards. Background technique [0002] With the development of science and technology in modern society, PCIE bus is widely used in computer systems as a high-performance I / O bus. SR-IOV (Single-Root I / O Virtualization, single-root I / O virtualization) is a standard introduced by PCI-SIG, which defines a standard mechanism of PCIE device virtualization technology and is a part of "virtual channel". This technology is used to virtualize one PCIE device into multiple PCIE devices, and each virtual PCIE device provides services for the upper layer software just like a physical PCIE device. [0003] Currently, PCIE devices need to be tested for performance after development. Traditional testing methods (such as the PCIe card testing device and method disclosed in patent document CN 110837445 A) can only test the ...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem that the traditional PCIE card testing method cannot realize synchronous performance testing of multiple virtual PCIE devices in the PCIE device, the present invention provides an asynchronous testing method and system based on multiple virtual PCIE cards

Images