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Integrated circuit testing method, computer readable medium, and integrated circuit testing apparatus

A technology of integrated circuits and testing methods, applied in the direction of electronic circuit testing, measuring devices, measuring electricity, etc.

Pending Publication Date: 2021-03-09
ASE (KUNSHAN) INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there is no effective time-saving and high-accuracy technology to make integrated circuit packaging products enter the electrical testing device in the same direction

Method used

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  • Integrated circuit testing method, computer readable medium, and integrated circuit testing apparatus
  • Integrated circuit testing method, computer readable medium, and integrated circuit testing apparatus
  • Integrated circuit testing method, computer readable medium, and integrated circuit testing apparatus

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Embodiment Construction

[0022] The following disclosure provides a variety of embodiments or exemplified, which can be used to implement different features of the present disclosure. The specific example system of the assembly and configuration described below is used to simplify the present disclosure. When it is conceivable, these descriptions are merely illustrative, which is not intended to limit the presentation. For example, in the description below, a first feature is formed on or above a second feature, which may include some embodiments in which the first and second features are directly in contact with each other; and may also include Some embodiments thereof include additional components to be formed between the first and second features, so that the first and second features may not be in direct contact. Further, the present disclosure may repeat the component symbols and / or labels in a plurality of embodiments. Such repetitive use is based on the simple and clear purpose, and it does not r...

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Abstract

An integrated circuit test method comprises the steps of receiving a first integrated circuit package product; acquiring an image of the first integrated circuit package product; setting a reference position according to the image of the first integrated circuit package product; performing an electrical test on the first integrated circuit package product; receiving a second integrated circuit package product; acquiring an image of the second integrated circuit package product; obtaining a test position according to the image of the second integrated circuit package product; selectively rotating the second integrated circuit package product according to the test position and the reference position; and performing an electrical test on the second integrated circuit package product.

Description

Technical field [0001] The present application is related to integrated circuitry, in detail, is related to an integrated circuit testing method, computer readable medium, and integrated circuit testing device. Background technique [0002] When an integrated circuit package product is prepared for electrical testing, the direction of the integrated circuit package product enters the electrical test device must be consistent. There is currently no technique that can save time and high and accurate rates to enable integrated circuit packages into the direction of the electrical test device. Inventive content [0003] In view of this, this application proposes an integrated circuit test method, computer readable medium, and an integrated circuit test device to solve the above problems. [0004] According to an embodiment of the present application, an integrated circuit test method includes: receiving a first integrated circuit package product; an image of the first integrated cir...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2891G01R31/2896
Inventor 顾耀王秀军孙广辉汪海潮叶锋
Owner ASE (KUNSHAN) INC
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