Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Sudden short circuit test method based on power electronic high-power power supply

A high-power power supply and short-circuit test technology, which is applied in the field of power electronics, can solve problems such as failure to meet, failure to adjust phase, failure to meet ratio requirements, etc., to achieve the effect of simplifying the wave modulation process and saving costs

Pending Publication Date: 2021-03-26
上海九志电气有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The traditional power supply can only output sine waves, and the phase cannot be adjusted. When the inductance in the loop is too small, it will not be able to meet the ratio of the first wave peak value to the steady-state effective value during the test, which is usually called the K value. Similarly, when the loop inductance When the

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sudden short circuit test method based on power electronic high-power power supply
  • Sudden short circuit test method based on power electronic high-power power supply
  • Sudden short circuit test method based on power electronic high-power power supply

Examples

Experimental program
Comparison scheme
Effect test
No Example Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a sudden short circuit test method based on a power electronic high-power power supply, and the method comprises the steps: calculating parameters of a wave modulation element according to loop parameters and the requirements for a waveform, and then calculating the instantaneous value of a voltage loaded on a test object according to the loop parameters after the wave modulation element is added, and loading the waveform into a high-power power supply based on a power electronic device as a modulation signal, so that the high-power power supply based on the power electronic device can realize the flexibility of the output waveform, and provides possibility for providing and outputting a special voltage waveform. By changing the voltage output waveform, the effect ofadding a wave modulation element in the system can be simulated, the cost of a hardware wave modulation element is saved, and meanwhile, the wave modulation process is simplified.

Description

technical field [0001] The invention relates to the technical field of power electronics, in particular to a sudden short-circuit test method based on a high-power power supply of power electronics. Background technique [0002] In the field of electrical equipment and product experiments, there are special requirements for the current waveform in some cases. In order to obtain a current waveform that meets the requirements, it is necessary to add voltage inductors or other components to the test circuit, such as the attenuation coefficient of the current. The traditional method is to realize this function by adjusting the parameters of the loop, which usually requires adding components such as inductors and resistors to the loop. [0003] The traditional power supply can only output sine waves, and the phase cannot be adjusted. When the inductance in the loop is too small, it will not be able to meet the ratio of the first wave peak value to the steady-state effective value...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/52G01R31/40G01R1/28
CPCG01R1/28G01R31/40G01R31/52
Inventor 顾凯郑晓东
Owner 上海九志电气有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products