Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Machine learning method and system

A technology of machine learning and mapping relationship, applied in the field of machine learning, can solve the problem of high development cost of machine learning and achieve the effect of reducing development cost

Pending Publication Date: 2021-04-16
HANGZHOU HIKVISION DIGITAL TECH
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Machine learning is expensive to develop due to the need to develop many different feature engineering methods

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Machine learning method and system
  • Machine learning method and system
  • Machine learning method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0049] In order to describe the machine learning method provided by the embodiment of the present invention more clearly, a possible application scenario of the machine learning method provided by the embodiment of the present invention will be illustrated below. It can be understood that the following example is only an implementation of the present invention A possible application scenario of the machine learning method provided in this example. In other poss...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention provides a machine learning method and system. The method comprises the steps that a decision-making end determines a target mapping relation identifier corresponding to a to-be-processed data set of an execution end according to a preset feature engineering strategy, and the target mapping relation identifier is used for representing a target mapping relation between original features of all objects in the to-be-processed data set and target features of all the objects, wherein the target feature is a feature obtained by performing feature engineering on the original feature according to a preset feature engineering strategy; the decision-making end sends the target mapping relationship identifier to the execution end; the execution end maps the original features of the to-be-processed data set according to the target mapping relationship represented by the target mapping relationship identifier to obtain the target features of each object; and the execution end performs machine learning based on the target features of each object to obtain a model for processing similar objects of each object. And the development cost of machine learning can be effectively reduced.

Description

technical field [0001] The present invention relates to the technical field of machine learning, in particular to a machine learning method and system. Background technique [0002] Electronic devices with machine learning capabilities can obtain a model through machine learning, which is used to represent the mapping relationship between features and results learned from a data set, and use the model for reasoning. However, in some application scenarios, there may not be an explicit mapping relationship between the features in the data set and the results, so it is difficult for electronic devices to learn a model that can effectively represent the mapping relationship between features and results based on these features in the data set, that is, the machine The efficiency of learning is low and the accuracy is poor. [0003] Therefore, in these application scenarios, it is necessary to perform feature engineering on the data set so that there is a more obvious mapping rel...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06N20/00
Inventor 李国琪
Owner HANGZHOU HIKVISION DIGITAL TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products