Failure test case generation method for model domain

A technology for test case generation and test cases, applied in neural learning methods, software testing/debugging, biological neural network models, etc., to improve the effect of defect location
CN112685327AActive Publication Date: 2021-04-20CHONGQING UNIV
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Patent Information

Authority / Receiving Office
CN Β· China
Current Assignee / Owner
CHONGQING UNIV
Publication Date
2021-04-20

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Abstract

The invention relates to a failure test case generation method for a model domain, and the method comprises the steps: firstly defining a minimum suspicious set, and extracting common features from all failure test cases; and then, for each failed test case in the model domain, on the basis of reserving the common characteristics of the failed test cases, mutating the information of the non-common characteristics so as to generate a new failed test case of the model domain; and finally, fusing the failure test cases of the newly added model domain into the original test case set, and carrying out defect positioning. According to the method, the variant nearest neighbor algorithm is used for generating the failure test case vector of the model domain, so that the purpose of improving the defect positioning effect is achieved, and compared with a traditional method for generating the test case from the input domain, the method is simpler and more effective, and a failure label does not need to be obtained through program execution.
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Description

technical field

[0001] The invention relates to a method for generating a failure test case, in particular to a method for generating a failure test case in a model domain. Background technique

[0002] In the process of software development and maintenance, the purpose of software debugging is to find and fix errors in the software. It is a time-consuming and labor-intensive process that often requires a significant investment of effort and time from developers. In order to reduce the cost of debugging, researchers have proposed many methods to help debuggers find defects in programs. A typical process of locating program defects is as follows: Suppose there is a program P with a test case set T constructed from the input domain, after the program P executes all the test cases in T, it will generate an information matrix of the model domain, see attached figure 1 . Then use the suspicious value calculation formula to calculate the coverage information of the model domai...

Claims

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