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Parallelism adjusting method

An adjustment method and parallelism technology, which are applied in the directions of instruments, measuring instrument components, measuring devices, etc., can solve the problems of poor parallelism, non-parallel reference planes, and inability to adjust the parallelism of workpieces, and achieve the effect of simple structure and convenient adjustment.

Active Publication Date: 2021-04-30
山东仕达思医疗科技有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Many equipment or instruments are not equipped with parallelism adjustment devices, such as slides on microscopes, which need to be adjusted to be in a horizontal state during use. If no adjustment is made, the measured plane and the equipment installation location will be The datum planes are not parallel, and the parallelism is much worse
Some detection devices are also provided in the prior art to detect parallelism. For example, the patent No. CN201210150537.8 provides such a detection device in a parallelism and height dimension detection device, but it can only be detected by reading values. Understand the parallelism of the workpiece, but cannot adjust the parallelism of the workpiece itself

Method used

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Embodiment

[0041] Parallelism adjusting method in the present embodiment, comprises the steps:

[0042] Step 1: Install the base 3 on the reference plane, the structure of the base 3 can be found in Figure 5 As shown, it includes a horizontal fixing surface 31 and a fourth connecting surface 32 protruding upwards. The fourth connecting surface 32 is perpendicular to the fixing surface 31 and is provided with three bolt holes of the same size. The fixing surface 31 A plurality of fixing holes 33 are arranged on the top, and the fixing surface 31 of the base 3 is fixed with the reference plane by passing bolts into the fixing holes 33 .

[0043] Step 2: install the second adjustment block 2 on the fourth connection surface 32 protruding upwards from the base 3, the structure of the second adjustment block 2 can be found in Figure 4 As shown, the middle is the second correction surface 21, the upper surface and the lower surface are respectively provided with the second connection surfac...

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Abstract

The invention provides a parallelism adjusting method which comprises the steps that 1, a base is installed on a reference plane, 2, a second adjusting block is installed on the base, and the lower portion of the second adjusting block is movably connected with the base through bolts, 3, adjusting screws are installed at the two ends of the second adjusting block, 4, the upper end of the second adjusting block is movably connected with a first adjusting block through bolts, the rotating direction of the first adjusting block is enabled to be perpendicular to that of the second adjusting block; 5, adjusting screws are installed at the two ends of the first adjusting block; 6, an object to be measured is fixed to the first adjusting block; 7, the height of two ends of the first adjusting block is measured, and the height of two ends of the first adjusting block is adjusted to be same; 8, the height of two ends of the second adjusting block is measured, and the height of two ends of the second adjusting block is adjusted to be identical. According to the method, the parallelism of the two directions is adjusted by adjusting the two adjusting blocks, finally, the plane of the object to be measured is parallel to the reference plane, the structure is simple, and adjustment is convenient.

Description

technical field [0001] The invention relates to the technical field of parallelism adjustment, in particular to a parallelism adjustment method. Background technique [0002] Many equipment or instruments are not equipped with parallelism adjustment devices, such as slides on microscopes, which need to be adjusted to be in a horizontal state during use. If no adjustment is made, the measured plane and the equipment installation location will be The datum planes are not parallel, and the parallelism is much worse. Some detection devices are also provided in the prior art to detect parallelism. For example, the patent No. CN201210150537.8 provides such a detection device in a parallelism and height dimension detection device, but it can only be detected by reading values. Understand the parallelism of the workpiece, but cannot adjust the parallelism of the workpiece itself. Contents of the invention [0003] In order to solve the above problems, the present invention provi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B5/02G01D11/30G01D11/00
CPCG01B5/02G01D11/30G01D11/00
Inventor 谢晓鸿谢时灵黄京鹏
Owner 山东仕达思医疗科技有限公司
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