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Appearance defect detection method and system

A detection method and technology for appearance defects, applied in image analysis, image enhancement, instruments, etc., can solve problems such as inability to adapt to product angle changes, incompatibility with simultaneous detection of large-scale defects, and achieve accurate and comprehensive detection results and reduce missed inspections. Effect

Active Publication Date: 2021-06-11
SHENZHEN HUAHAN WEIYE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] This application provides an appearance defect detection method and system, aiming to solve the problem that the existing appearance defect detection method cannot be compatible with the simultaneous detection of large-scale defects and small defects, and cannot The problem of adapting to product angle changes

Method used

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  • Appearance defect detection method and system
  • Appearance defect detection method and system

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Embodiment Construction

[0062] The present invention will be further described in detail below through specific embodiments in conjunction with the accompanying drawings. Wherein, similar elements in different implementations adopt associated similar element numbers. In the following implementation manners, many details are described for better understanding of the present application. However, those skilled in the art can readily recognize that some of the features can be omitted in different situations, or can be replaced by other elements, materials, and methods. In some cases, some operations related to the application are not shown or described in the description, this is to avoid the core part of the application being overwhelmed by too many descriptions, and for those skilled in the art, it is necessary to describe these operations in detail Relevant operations are not necessary, and they can fully understand the relevant operations according to the description in the specification and genera...

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Abstract

The invention discloses an appearance defect detection method and system, and the method comprises the steps: carrying out the zooming of different sizes of an image to be detected of an object to be detected, obtaining a small-zooming-size image and a large-zooming-size image, and carrying out the direction filtering and direction weight fusion of a plurality of different directions, obtaining a background estimation image related to small-size defects and a background estimation image related to large-size defects, performing the difference operation on an image to be detected and the two background estimation images, and obtaining a small-size defect emphasis image and a large-size defect emphasis image; calculating the weighted sum of the small-size defect emphasis graph and the large-size defect emphasis graph to obtain an overall defect emphasis graph, and performing threshold segmentation on the overall defect emphasis graph to obtain a defect area of the to-be-detected object so as to realize compatible detection of small-size defects and large-size defects; carrying out direction filtering in multiple different directions on the small-scaling-size image and the large-scaling-size image, so that the method can adapt to the angle change of the to-be-detected object.

Description

technical field [0001] The invention relates to the technical field of machine vision, in particular to a method and system for detecting appearance defects. Background technique [0002] With the advancement of science and technology, the appearance defect detection based on machine vision is becoming more and more popular in the industrial automation production process. Curved surface modeling has a good feel and look, and it is more and more common in modern industrial design, but its processing and manufacturing is also more difficult than ordinary flat modeling. Generally, five-axis CNC (Computer number control, computer numerical control) machine tools are used. Or standard molds for processing and manufacturing. At the same time, the appearance defects produced during the processing are also difficult to detect. At present, manual visual inspection is mainly used, but there are disadvantages such as low detection efficiency, high labor intensity, and the detection ac...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T7/12G06T7/13G06T7/136
CPCG06T7/0004G06T7/136G06T7/12G06T7/13G06T2207/30108G06T2207/10012
Inventor 黄涛
Owner SHENZHEN HUAHAN WEIYE TECH
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