Defect detection method and device, electronic equipment and computer readable storage medium

A defect detection and computer program technology, applied in the field of image processing, can solve the problems of reducing the accuracy of the detection model and affecting the training accuracy of the defect detection model.

Active Publication Date: 2021-09-10
SHANGHAI WINGTECH INFORMATION TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The defect of the existing scheme is that the training of the defect detection model requires a large number of training samples, and the selection of the training samples will directly affect the training accuracy of the defect detection model. If the training samples are not selected properly, the trained defect detection model will The accuracy of

Method used

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  • Defect detection method and device, electronic equipment and computer readable storage medium
  • Defect detection method and device, electronic equipment and computer readable storage medium
  • Defect detection method and device, electronic equipment and computer readable storage medium

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Embodiment Construction

[0040] In order to more clearly understand the above objects, features and advantages of the present disclosure, the solutions of the present disclosure will be further described below. It should be noted that, in the case of no conflict, the embodiments of the present disclosure and the features in the embodiments can be combined with each other.

[0041] In the following description, many specific details are set forth in order to fully understand the present disclosure, but the present disclosure can also be implemented in other ways than described here; obviously, the embodiments in the description are only some of the embodiments of the present disclosure, and Not all examples.

[0042] In one embodiment, such as figure 1 As shown, a defect detection method is provided. In this embodiment, the method is applied to a terminal for illustration. It can be understood that the method can also be applied to a server, and can also be applied to a system including a terminal and...

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Abstract

The invention relates to a defect detection method and device, electronic equipment and a computer readable storage medium. The method comprises the following steps: carrying out graying processing on a to-be-detected image to obtain a grayscale image; determining gray scale information of a background in the gray scale image and gray scale information of a target object in the gray scale image according to the gray scale value of each pixel point in the gray scale image; performing ternary processing on the grayscale image according to the grayscale information of the background and the grayscale information of the target object; and determining defect information in the to-be-detected image according to a ternary processing result. According to the embodiment of the invention, the defect detection precision of the image can be effectively improved.

Description

technical field [0001] The present disclosure relates to the technical field of image processing, and in particular to a defect detection method, device, electronic equipment and computer-readable storage medium. Background technique [0002] Defect detection usually refers to the detection of surface defects of objects. Surface defect detection uses advanced machine vision detection technology to detect defects such as spots, pits, scratches, color differences and defects on the surface of workpieces. Defect detection can be applied to items that have strict requirements on appearance and clear indicators, such as metal surfaces, glass instant noodles, paper surfaces, and electronic component surfaces. [0003] The current defect detection technology is mainly based on the defect detection model to realize defect detection, that is, collect a large number of defect training samples in advance, perform binary processing on the defect image to obtain a binary image, and then ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06K9/62G06T7/194G06T7/90
CPCG06T7/0004G06T7/90G06T7/194G06T2207/10024G06T2207/30108G06F18/23
Inventor 徐崚川
Owner SHANGHAI WINGTECH INFORMATION TECH CO LTD
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