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A kind of detection method of display backplane and its detection structure

A technology of display backplane and detection structure, applied in the direction of semiconductor/solid-state device testing/measurement, electrical components, circuits, etc., can solve the problems of many steps and complicated operations, and achieve the effect of obvious results, easy judgment, and convenient maintenance.

Active Publication Date: 2022-07-29
CHONGQING KONKA PHOTOELECTRIC TECH RES INST CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, the existing detection method is to detect and judge by lighting up the chip after the mass transfer. In this way, after detecting the bad point, the chip needs to be removed, repaired, and then the chip is soldered again. There are many steps and complicated operations.

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  • A kind of detection method of display backplane and its detection structure
  • A kind of detection method of display backplane and its detection structure
  • A kind of detection method of display backplane and its detection structure

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Embodiment Construction

[0033] In order for those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only These are some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0034] In the prior art, Micro LED displays, as the mainstream of new types of displays, have good stability, long life, and advantages in operating temperature, and also inherit the low power consumption, color saturation, and fast response speed of LEDs. , strong contrast and other advantages, has great application prospects.

[0035] Commo...

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Abstract

The invention discloses a detection method for a display backplane and a detection structure thereof, wherein the detection method comprises: providing a display backplane with contact electrode pairs arranged on the display backplane; providing a detection structure, the detection The structure includes a light-emitting element and a detection circuit for conducting an electrical signal to the light-emitting element; the detection structure is assembled on the display back panel, so that the detection circuit is connected with the contact electrode pair; The contact electrode pair outputs a driving electrical signal; if the light-emitting element does not emit light, it is determined that the contact electrode pair is a dead pixel. In the detection method of the present invention, by assembling the detection structure on the display backplane, outputting an electrical signal to the display backplane, and directly detecting whether the contact electrode pair works normally by whether the light-emitting element emits light, it can timely detect whether there is damage on the display backplane, Convenient and timely maintenance.

Description

technical field [0001] The present invention relates to the technical field of display devices, in particular to a detection method of a display backplane and a detection structure thereof. Background technique [0002] With the rapid development of display technology and the progress of light-emitting diode (Light Emitting Diode, LED) production technology, displays have shown a development trend of high integration and low cost. As a new generation display technology, Micro LED has higher brightness, better luminous efficiency, but lower power consumption than the existing organic light-emitting diode (Organic Light-Emitting Diode, OLED) technology, and has great application prospects. At present, in the production process of Thin Film Transistor Liquid Crystal Display (TFT-LCD), due to the manufacturing process, there may be defects on the display backplane, thereby affecting the subsequent chip lighting effect. Therefore, in a common production process, the backplane of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66
CPCH01L22/34H01L22/12
Inventor 王广徐瑞林林建宏
Owner CHONGQING KONKA PHOTOELECTRIC TECH RES INST CO LTD