Unlock instant, AI-driven research and patent intelligence for your innovation.

Image-sensing system and detection and correction method for defective photosensitive element

A technology of image sensing and image sensor, which is applied to TV system components, electrical components, image communication, etc., and can solve the problem of decreased power consumption of buffers and other issues

Active Publication Date: 2021-10-26
SILICON OPTRONICS
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Buffer requirements and power consumption are significantly reduced

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Image-sensing system and detection and correction method for defective photosensitive element
  • Image-sensing system and detection and correction method for defective photosensitive element
  • Image-sensing system and detection and correction method for defective photosensitive element

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] A variety of embodiments of the present invention will be described below. The basic concepts of the present invention are described below and is not intended to limit the contents of the invention. The scope of the actual invention should be defined in accordance with the scope of the application.

[0041] figure 1 An image sensing system 100 implemented in accordance with an embodiment of the present case, for example, a camera, or a camera. Image sensing system 100 includes an image sensor 102 (e.g., CMOS Image Sensor), a defective pixel detection and correction circuit 104, and an image processor 106. The defective pixel detection and correction circuit 104 are coupled between the image sensor 102, and between the image processor 106, including one operation unit 108, and a defect buffer 110. The arithmetic unit 110 can include a logical operation hardware, and a memory containing a hardware operation code. The arithmetic unit 110 detects a defective photosensitive ele...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An image-sensing system and a detection and correction method for a defective photosensitive element. An image-sensing system for the efficient detection of defective photosensitive elements is shown. An arithmetic logic unit (ALU) determines a defective pixel candidate of an image sensor based on the first frame captured by the image sensor, performs a lower-part comparison on the defective pixel candidate based on the first frame, and performs an upper-part comparison on the defective pixel candidate based on the second frame captured by the image sensor. The defective pixel candidate is confirmed to be defective based on the first frame as well as the second frame. The arithmetic logic unit buffers, in the first frame, a plurality of pieces of pixel data of the row where the defective pixel is into a defect buffer for lower-part comparison of the defective pixel candidate. The arithmetic logic unit buffers, in the second frame, a plurality of pieces of pixel data of the row where the defective pixel is into the defect buffer for upper-part comparison of the defective pixel candidate.

Description

Technical field [0001] This case is the detection and correction of the defective photosensitive element of the image sensor. Background technique [0002] Image sensor (e.g., CMOS image sensor) may have a sensor with a defect (DEFECT) at the factory, and the degree of reaction to the light is significantly different from the surrounding photosensitive element. Even some photosensitive elements may only be fixed to the output bright order, or the fashion. The above defects may also be due to the factory, the external environment is caused. For example, some photosensitive elements may be defects due to aging. Photoreceptor defects affect the overall image quality of the image. [0003] The defects of the photosensitive elements can be detected by the ratio between the plurality of pixels, and the photographic results based on the peripheral pixels are modified. Traditional techniques are typically a special planning buffer (LINE BUFFER) to demonstrate pixel data to provide defect...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/367H04N5/353
CPCH04N25/53H04N25/68H04N25/683H04N25/44H04N25/58
Inventor 林俊宏
Owner SILICON OPTRONICS
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More