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High and low temperature test box

A technology of high and low temperature test chambers and test chambers, which is applied in the direction of laboratory appliances, heating or cooling equipment, shells or chambers, etc., and can solve problems such as unsatisfactory airflow speeds

Pending Publication Date: 2021-10-29
SHANGHAI EMBEDWAY INFORMATION TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The airflow velocity of the above-mentioned air outlet cannot meet the requirement of less than 0.2m / s in relevant tests of the environmental test standard GB-T 2423

Method used

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  • High and low temperature test box

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Embodiment Construction

[0029] The invention discloses a high and low temperature test chamber, which can provide cooling capacity to ensure that the system will not significantly reduce the power generation due to the extra cooling.

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] Such as figure 1 As shown, the embodiment of the present invention provides a high and low temperature test chamber, which includes a main body of the test chamber and an airflow regulating device arranged in the main body of the test chamber. ...

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Abstract

The invention discloses a high and low temperature test box, which comprises a test box main body, and an airflow adjusting device arranged in the test box main body. The airflow adjusting device comprises a plurality of outer walls, and a cavity for accommodating a tested object is defined by the plurality of outer walls. At least one of the plurality of outer walls is an airflow adjusting plate with an opening structure for airflow to enter the cavity, and the airflow in the test box main body enters the cavity through the opening structure of the airflow adjusting plate. According to the high and low temperature test box provided by the invention, the airflow adjusting device is arranged in the test box main body, so that the temperature in the cavity is approximately the same as the temperature in the test box main body (outside the airflow adjusting device) under the action of heat conduction, and the ambient temperature of a tested object is not influenced; moreover, through the opening structure of the air flow adjusting plate, the speed of the air flow reaching the tested object can be adjusted, so that adjustment can be carried out according to the test standard, and the requirements of the environment test standard on air flow speed parameters are met.

Description

technical field [0001] The invention relates to the technical field of test equipment, in particular to a high and low temperature test chamber. Background technique [0002] The current high and low temperature test chamber is a common bellows, that is, the purpose of temperature control is achieved by supplying air to the main body of the test chamber. The main body of the test box cannot artificially control the airflow speed. For example, the airflow velocity at the air outlet of the test box can reach 4m / s, the airflow velocity at the central test point is 0.5-1m / s, and the four-corner test point is 0.5m / s. The airflow velocity of the above-mentioned air outlet cannot meet the requirement of less than 0.2m / s in relevant tests of the environmental test standard GB-T 2423. [0003] Therefore, how to adjust the airflow velocity to meet the requirements of the environmental test standard on the airflow velocity parameter is an urgent problem to be solved by those skilled ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B01L1/00B01L7/00
CPCB01L1/00B01L7/00
Inventor 周新波
Owner SHANGHAI EMBEDWAY INFORMATION TECH
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