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Junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum

A test method and temperature-dependent technology are applied in the field of junction temperature testing devices based on the relative spectrum of LEDs that change with temperature, which can solve the problems of difficulty in unifying accuracy and convenience, and difficulty in measurement, and achieve small driving current and reduced measurement. Error, easy adjustment effect

Active Publication Date: 2015-04-01
LINGTONG EXHIBITION SYST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to overcome the existing junction temperature measurement method, which is difficult to achieve unification of accuracy and convenience, and difficult to measure, to provide a junction temperature test device and method based on LED relative spectrum changes with temperature, using The technical solution provided by the invention not only can make the measurement of LED junction temperature more accurate, reliable and convenient, but also has the characteristics of simplicity, practicality and low cost

Method used

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  • Junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum
  • Junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum
  • Junction temperature testing method based on temperature variation of LED (light-emitting diode) relative spectrum

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Embodiment

[0037] combine figure 1, a junction temperature test device based on the change of LED relative spectrum with temperature in this embodiment, including a driving power supply 1, a thermostat 2, a lamp holder 3, an integrating sphere 5, a spectrum analyzer 6 and a computer 7. One end of the spectrum analyzer 6 is connected to the integrating sphere 5, and the other end is connected to the computer 7. The spectrum analyzer 6 is used to collect the spectrum of the LED4 to be measured, and the collected spectrum is transmitted to the computer 7. The computer 7 is used for recording and recording. Process the spectral data, because the inner surface of the integrating sphere 5 is coated with non-wavelength-selective diffuse reflective white paint, the illuminance of the LED4 to be measured in any direction in the integrating sphere 5 is equal, so that the spectral analyzer 6 collects The spectrum is more accurate, which improves the accuracy of the test; the driving power supply 1 ...

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Abstract

The invention discloses a junction temperature testing device and a junction temperature testing method based on the temperature variation of LED (light-emitting diode) relative spectrum, belonging to the field of LED photoelectric detection. The junction temperature testing device based on the temperature variation of the LED relative spectrum comprises a driving power supply, a thermostat, an integrating sphere and a spectrum analyzer; based on the principle of correlation between LED junction temperature and the relative spectrum, on the one hand, the temperature of an LED to be tested is controlled through the thermostat, and the LED to be tested is driven to illuminate by using small current; and on the other hand, the relative spectrum of the LED to be tested is collected through the spectrum analyzer, the relation formula of junction temperature characterization parameter and LED junction temperature is obtained through fitting by adopting the area formed by enclosing of the relative spectrum under different temperatures and a reference relative spectrum as the junction temperature characterization parameter. The invention aims at providing the accurate, reliable, convenient, simple, practical and low-price LED junction temperature testing device and the LED junction temperature testing method.

Description

technical field [0001] The present invention relates to an LED junction temperature testing device and its method, more specifically, to a junction temperature testing device and its method based on the change of LED relative spectrum with temperature. Background technique [0002] LED (light emitting diode) has many advantages such as small size, long life, high brightness, energy saving and environmental protection, etc. It is considered to be the most potential fourth-generation lighting source, and has been widely used in signal indication, display and general lighting and other fields. The photoelectric color characteristics of the LED itself are closely related to the temperature. As the junction temperature increases, the luminous efficiency of the LED decreases and the life span is shortened. Therefore, it is of great significance to quickly, scientifically and conveniently measure the LED junction temperature, especially the junction temperature of the packaged LED ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K11/00
Inventor 饶丰徐安成朱锡芳杨武胡春香
Owner LINGTONG EXHIBITION SYST
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