Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A semiconductor connector testing device and method of using the same

A technology for testing equipment and connectors, which is used in semiconductor/solid-state device testing/measurement, semiconductor/solid-state device manufacturing, electrical components, etc. The effect of efficiency, reducing difficulty and improving production efficiency

Active Publication Date: 2022-01-04
NANTONG HUALONG MICROELECTRONICS
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In daily production, several pins need to be plugged into the semiconductor connector, and the insufficient number of pins will directly lead to the scrapping of this kind of semiconductor connector, and the detection of this kind of semiconductor connector is usually by manual visual inspection , after a long period of visual inspection of the same product, human eyes are tired, resulting in the occurrence of missed inspections, and after the visual inspection is completed, it is necessary to perform grooving processing on this kind of semiconductor connector. Therefore, it is necessary to provide a convenient It is necessary to have a semiconductor connector inspection device and its use method for visual inspection and simultaneous grooving processing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A semiconductor connector testing device and method of using the same
  • A semiconductor connector testing device and method of using the same
  • A semiconductor connector testing device and method of using the same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0049] Such as Figure 1-12 As shown, the present invention provides a semiconductor connector detection device and its use method, including: a frame 100, a movable detection mechanism 300 is installed on the frame 100; a feeding part 200, the feeding part 200 Set on the frame 100, the feeding part 200 is used for conveying materials with several pins 000, the feeding part 200 has a detection gap 210; the detection mechanism 300 includes a detection device that can slide toward the detection gap 210 Board 310 and the detection slider 320 slidingly connected on the detection board 310, the detection slider 320 is provided with a number of detection blind holes 321 corresponding to each pin 000 one by one, the detection slider 320 is set There are stoppers 400 corresponding to the detection blind holes 321 one by one, and a plurality of grooving knives 500 are telescopically arranged on the detection plate 310, and each of the grooving cutters 500 and each of the stoppers 400 ...

Embodiment 2

[0078] The present invention also provides a method of using the above detection equipment to detect materials:

[0079] S1. The feeding part 200 sends the material to be detected to the detection gap 210;

[0080] S2. The horizontal cylinder 330 works to push the detection plate 310 close to the material to be detected;

[0081] S3. Insert the pin 000 of the material to be detected into the detection blind hole 321;

[0082] S4. When the material is a good product, the detection slider 320 is limited by the pin 000, the detection plate 310 continues to approach the workpiece, the push block 312 is raised, and the grooving tool 500 is offset against the pin 000 ; When the material is a defective product, the detection slider 320 follows the detection plate 310 close to the workpiece, bends the pin 000, and manually takes out the material;

[0083] S5. The vertical cylinder 220 works to squeeze the material downward, and at the same time, the push block 312 moves upward, and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a semiconductor connector detection device and its use method, comprising: a frame, a detection mechanism and a feeding part, the feeding part has a detection gap; the detection mechanism includes a detection plate capable of sliding toward the detection gap and a sliding connection The detection slider on the detection board is provided with a number of detection blind holes corresponding to each pin one by one, and the detection slider is provided with a limit part corresponding to the detection blind hole one by one, and the detection board is scalable A number of grooving knives are arranged in a grounded manner, and each grooving tool corresponds to each limiting part one by one, and the grooving tool snaps into the corresponding limiting part, so that the detection board is tightened, and the pin can be inserted into the detection blind hole. Push the corresponding limit part to make the grooving tool come out of the corresponding limit part; when a good product is detected, the detection plate can continue to move until the grooving tool slides out, and the grooving tool can slide upwards to achieve alignment. Grooving processing of materials, thereby improving the production efficiency of materials.

Description

technical field [0001] The invention relates to testing equipment, in particular to a testing equipment for a semiconductor connector and a method for using the same. Background technique [0002] In daily production, several pins need to be plugged into the semiconductor connector, and the insufficient number of pins will directly lead to the scrapping of this kind of semiconductor connector, and the detection of this kind of semiconductor connector is usually by manual visual inspection , after a long period of visual inspection of the same product, human eyes are tired, resulting in the occurrence of missed inspections, and after the visual inspection is completed, it is necessary to perform grooving processing on this kind of semiconductor connector. Therefore, it is necessary to provide a convenient It is necessary to have a semiconductor connector inspection device and its application method for visual inspection and simultaneous grooving processing. Contents of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66H01L21/67H01L21/677H01L21/48
Inventor 郑剑华苏建国张元元孙彬朱建
Owner NANTONG HUALONG MICROELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products