Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Bug data analysis method and device

An analysis method and data technology, applied in the computer field, can solve problems such as the lack of departmental attributes of bug data and the inability to provide bug analysis capabilities, so as to avoid a large backlog of data, facilitate viewing, and reduce data omissions

Pending Publication Date: 2021-12-07
BEIJING JINGDONG TUOXIAN TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The bug data exported from the JIRA system lacks department attributes, which makes it unable to provide department-level bug analysis capabilities

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Bug data analysis method and device
  • Bug data analysis method and device
  • Bug data analysis method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] Exemplary embodiments of the present invention are described below in conjunction with the accompanying drawings, which include various details of the embodiments of the present invention to facilitate understanding, and they should be regarded as exemplary only. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the invention. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.

[0038] figure 1 is a schematic diagram of the main steps of the method for analyzing bug data according to an embodiment of the present invention. Such as figure 1 As shown, the analysis method of bug data in the embodiment of the present invention mainly includes the following steps:

[0039] Step S101: Obtain bug data. The bug data is stored in the JIRA system consti...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a bug data analysis method and device, and relates to the technical field of computers. A specific embodiment of the method comprises the following steps: acquiring bug data; wherein the bug data comprise a bug acceptor identifier; according to the bug acceptor identifier, inquiring information of a department to which a bug acceptor belongs, and updating the inquired department information to the bug data; and according to the updated bug data, generating a bug analysis result of the department dimension. According to the method, the information of the department to which the bug acceptor belongs is acquired according to the bug acceptor identifier of the bug data, so that the department information is combined with the bug data, and bug data analysis of department dimensions is realized.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a bug data analysis method and device. Background technique [0002] JIRA is a project and transaction tracking tool produced by Atlassian, which can help project-related personnel manage bugs (defects) found in projects, standardize the bug transfer process, and provide bug analysis in dimensions such as bug status, bug type, and bug introduction stage. Capabilities, and then expose the problems in the project, and provide a basis for the improvement of the testing process and development process. [0003] In the process of realizing the present invention, there are at least the following problems in the prior art: [0004] The bug data exported from the JIRA system lacks department attributes, which makes it unable to provide department-level bug analysis capabilities. Contents of the invention [0005] In view of this, an embodiment of the present invention provides a me...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06Q10/10
CPCG06F11/3692G06Q10/103
Inventor 胡庆朋
Owner BEIJING JINGDONG TUOXIAN TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com