Integrated circuit chip detection equipment and test method

Abstract

The invention relates to the technical field of circuit chip detection, and discloses integrated circuit chip detection equipment and a test method. The integrated circuit chip detection equipment comprises a supporting box, a pressing assembly arranged at the top of the supporting box, a sweeping assembly arranged in the pressing assembly and a linkage assembly arranged on the outer surface of the sweeping assembly, wherein the sweeping assembly comprises a supporting seat, a sweeping box erected at the top of the supporting seat, a servo motor erected on the right side of the sweeping box, a lead screw arranged on the left side of the servo motor and a bearing arranged on the left side of the lead screw; the supporting box comprises a detection assembly, and the detection assembly is located above the pressing assembly; and the pressing assembly comprises a detection box and two spring assemblies arranged on the inner wall of the detection box. According to the integrated circuit chip detection equipment and the test method, the lead screw is arranged on the left side of the servo motor, a rotating block can rotate on the surface of the lead screw through power of the servo motor, and the rotating block and a sliding block are fixedly connected, so that the rotating block can drive the sliding block to move left and right.

Description

technical field [0001] The invention relates to the technical field of circuit chip detection, in particular to an integrated circuit chip detection device and a testing method. Background technique [0002] An integrated circuit chip is a miniature electronic device or component. It uses a certain process to interconnect components such as transistors, diodes, resistors, capacitors, and inductors required in a circuit, and interconnects them in one or several small pieces. Semiconductor wafers or dielectric substrates, and then packaged in a package to become a microstructure with the required circuit functions. [0003] Existing integrated circuit chip testing equipment and testing methods are becoming more and more perfect, and they usually have the characteristics of easy and fast testing when used. For example, Chinese patent 202110383702.2 is an integrated circuit chip testing equipment and testing method. The equipment observes the chip through a camera on a fixed pla...

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Problems solved by technology

[0005] Aiming at the deficiencies of the prior art, the present invention provides an integrated circuit chip testing device and testing method, which has the advantages of being convenient to clean the dust on the surface of the chip, and solves the problem that the existing chip testing equipment on the market is difficult to clean the surface. The problem

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