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Test equipment and test system

A technology of testing equipment and testing system, which is applied in transmission system, electronic circuit testing, measuring electricity, etc., can solve the problem of limited testing efficiency of chip testing scheme, achieve the effect of improving testing efficiency and reducing testing error

Pending Publication Date: 2022-01-28
SHANGHAI AWINIC TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The test efficiency of the existing chip test scheme is limited, and it is urgent to propose a test scheme and system to overcome the above problems

Method used

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Embodiment Construction

[0024] The study found that the reason for the limited test efficiency of chips in the prior art is that the existing burn-in test scheme can only perform a long-term burn-in test on 2 chips at a time, so the test efficiency is low.

[0025] In addition, the research also found that, since multiple computers need to be configured for testing multiple power amplifier chips in the prior art, the test environments for each chip are likely to be different, resulting in errors in the test results.

[0026] Therefore, it is necessary to propose a new test equipment and test system, which can test at least two chips under test at the same time, thereby improving the test efficiency, and keeping each chip under test to be tested in the same test environment as much as possible.

[0027] The test equipment and the test system will be further described below in conjunction with the accompanying drawings and embodiments.

[0028] see figure 1 , is a schematic structural diagram of the t...

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Abstract

The invention discloses test equipment and a test system. The test efficiency can be improved. The test equipment comprises a main test module which is used for being connected to an external upper computer so as to acquire a test instruction given by the external upper computer; more than two sub-test modules which are connected to the main test module; each sub-test module tests at least one to-be-tested chip according to the corresponding test instruction managed and issued by the main test module.

Description

technical field [0001] This application relates to the field of chip testing, in particular to testing equipment and a testing system. Background technique [0002] Chip testing can be used to evaluate the reliability of chip circuits, such as the aging test commonly used in the prior art, which can detect the life of the chip and the reliability of long-term power-on operation, thereby helping developers to know the current reliability of the chip. [0003] The test efficiency of the existing chip test scheme is limited, and it is urgent to propose a test scheme and system to overcome the above problems. Contents of the invention [0004] In view of this, the present application provides a testing device and a testing system, which can improve testing efficiency. [0005] A test device provided by the present application includes: a main test module, which is used to connect to an external host computer to obtain test instructions given by the external host computer; mor...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28H04L67/01H04R1/20
CPCG01R31/2855G01R31/2851H04R1/20H04L69/26
Inventor 赵旭
Owner SHANGHAI AWINIC TECH CO LTD