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Memory testing method and device

A memory testing, memory technology, applied in faulty hardware testing methods, error detection/correction, detection of faulty computer hardware, etc.

Pending Publication Date: 2022-02-18
SUGON INFORMATION IND
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the embodiments of the present application is to provide a memory testing method and device to solve the problem that the current memory testing scheme cannot perform in-depth test and analysis on memory quality, thus causing potential quality risks in the memory

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Embodiment Construction

[0040] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.

[0041] An embodiment of the present application provides a memory testing method, which can be applied to a computing device, which can be a computer or a server, so as to perform in-depth analysis of the memory quality, such as figure 1 Shown, this memory test method comprises the steps:

[0042] Step S100: Test the memory to be tested by using a preset test template, and go to step S110 when the memory to be tested is judged to be non-defective according to the test result.

[0043] Step S110: Perform a comprehensive test on the memory to be tested. The comprehensive test includes performing parameter analysis on the memory parameters of the memory to be tested under preset multi-type working environments to obtain a first static analysis measurement value of the memory to be tested.

[0044] Ste...

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Abstract

The invention provides a memory testing method and device. The memory testing method comprises the steps that a preset testing template is used for testing a to-be-tested memory, and when it is judged that the to-be-tested memory is a non-defective product according to a testing result, comprehensive testing is conducted on the to-be-tested memory. The comprehensive test comprises the following steps: performing parameter analysis on memory parameters of each particle in a to-be-tested memory in a preset multi-class working environment to obtain a first static analysis measurement value of the to-be-tested memory; and when the first static analysis measurement value does not meet a preset first standard threshold value, determining that the to-be-tested memory is a defective product, thereby performing further deep quality analysis on the to-be-tested memory which is not the defective product through preliminary screening by adopting a comprehensive test, and further performing more accurate judgment on the memory quality to effectively identify and intercept the low-quality memory.

Description

technical field [0001] The present application relates to the technical field of memory testing, in particular, to a memory testing method and device. Background technique [0002] The operation of all programs in the computer is inseparable from the memory, so the performance and quality of the memory have a great impact on the computer. As a high-performance computer, the server runs faster and has a higher load than ordinary computers. As a node of the network, it stores and processes various data and information on the network. For a server manufacturer, the safety and reliability of the server is the key The most basic guarantee for customers is that memory failures still account for a high proportion of servers. How to ensure the quality of memory components has become an important hurdle for major server manufacturers to improve product quality. [0003] At present, server manufacturers generally use software to test memory, such as Memtester, a Linux-based memory te...

Claims

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Application Information

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IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2273
Inventor 张迎华蒲嘉鹏刘晓玲王凯东董艳芳贾淳
Owner SUGON INFORMATION IND
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