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Integrated assayer for photoelectric performance

A technology for comprehensive testing and optoelectronic performance, applied in measurement devices, optical instrument testing, photovoltaic power generation, etc., can solve problems such as low efficiency, poor reproducibility, and low measurement accuracy, and achieve simple operation, good reproducibility, and testing speed. quick effect

Inactive Publication Date: 2005-01-12
SOUTHEAST UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Technical problem: The purpose of this invention is to provide an integrated photoelectric performance comprehensive testing device for photoelectric conversion materials and devices, which can automatically perform adjustment, measurement and data processing, and solve the problems of low efficiency, low measurement accuracy and poor reproducibility of current devices of this type. Shortcomings

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Embodiment Construction

[0025] The invention is a device for measuring the photoelectric properties of photoelectric conversion materials and devices, including a light source, a sample chamber, a detection system, a control system, and the like. In the device, the xenon lamp light source 1 is used as a simulated solar light source, the grating monochromator 3 and the xenon lamp light source 1 are connected by an optical fiber guide beam 21, and the grating monochromator 3 is connected with the test dark box 5 by an optical fiber guide light beam 22; The photocell 51, the photometer sensor 52, the output terminal of the photocell 51 is connected to the voltage / ammeter 4, the output terminal of the photometer sensor 52 is connected to the photometer host 7, and the output terminals of the photometer host 7 and the voltage / ammeter 4 are connected to the computer through the data acquisition interface 6 is connected, and the light intensity irradiated on the photovoltaic cell 51 is measured in situ. A t...

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Abstract

The testing device is in use for measuring photoelectric properties of photovoltaic conversion materials and parts. In the device, xenon lamp simulates sunlight source. Optical fiber (21) of guiding light beam connects grating monochromator with xenon lamp, and optical fiber (22) of guiding light beam connects grating monochromator with testing dark box, where there are photocell and sensor of photometer inside. Output end of photocell is connected to voltage / current meter. Output end of sensor of photometer is connected to photometer. Output ends of photometer and voltage / current meter through data acquisition interface is connected to computer for in site measuring luminous intensity irradiated on photocell. Sensor of photometer is placed on the position the photocell located.

Description

technical field [0001] The invention is a device for measuring the photoelectric properties of photoelectric conversion materials and devices, especially a test instrument for photoelectric conversion properties of photoelectrochemical solar cells. Background technique [0002] There are two-electrode and three-electrode methods for testing photoelectric properties of photoelectric conversion materials and devices (such as photovoltaic cells), and the two-electrode method is more commonly used. What has been reported are discrete devices assembled by some research institutions. A pulsed xenon (Xe) lamp was used to simulate the solar light source to illuminate the photocell, and the performance parameters of the photocell were obtained by measuring the voltage and current data of the photocell under the illumination of the simulated light source and comparing the measurement data of the standard photocell. The whole process has a low degree of automat...

Claims

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Application Information

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IPC IPC(8): G01M11/00G01N21/00G01R31/00H02S50/15
CPCY02E10/50
Inventor 李康孙岳明马春光袁春伟
Owner SOUTHEAST UNIV
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