Integrated assayer for photoelectric performance

A technology for comprehensive testing and photoelectric performance, applied in measuring devices, optical instrument testing, photovoltaic power generation, etc., can solve problems such as low efficiency, low measurement accuracy, and poor reproducibility, and achieve simple operation, good reproducibility, and test speed fast effect

Inactive Publication Date: 2007-02-14
SOUTHEAST UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Technical problem: The purpose of this invention is to provide an integrated photoelectric performance comprehensive testing device for photoelectric conversion materials and devices, which can automatically perform adjustment, measurement and data processing, and solve the problems of low efficiency, low measurement accuracy and poor reproducibility of current devices of this type. Shortcomings

Method used

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  • Integrated assayer for photoelectric performance
  • Integrated assayer for photoelectric performance

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Embodiment Construction

[0025] The invention is a device for measuring the photoelectric properties of photoelectric conversion materials and devices, including a light source, a sample chamber, a detection system, a control system and the like. In this device, the xenon lamp light source 1 is used as a simulated solar light source, the grating monochromator 3 is connected with the xenon lamp light source 1 with an optical fiber light guide 21, and the grating monochromator 3 is connected with the test obscura 5 with an optical fiber guide beam 22; the test obscura 5 is equipped with Photocell 51, photometer sensor 52, the output terminal of photocell 51 is connected to voltage / ammeter 4, the output terminal of photometer sensor 52 is connected to photometer host 7, and the output terminal of photometer host 7 and voltage / ammeter 4 is connected to computer through data acquisition interface 6 are connected, and the light intensity irradiated on the photocell 51 is measured in situ. In test dark box 5...

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Abstract

The testing device is in use for measuring photoelectric properties of photovoltaic conversion materials and parts. In the device, xenon lamp simulates sunlight source. Optical fiber (21) of guiding light beam connects grating monochromator with xenon lamp, and optical fiber (22) of guiding light beam connects grating monochromator with testing dark box, where there are photocell and sensor of photometer inside. Output end of photocell is connected to voltage / current meter. Output end of sensor of photometer is connected to photometer. Output ends of photometer and voltage / current meter through data acquisition interface is connected to computer for in site measuring luminous intensity irradiated on photocell. Sensor of photometer is placed on the position the photocell located.

Description

technical field [0001] The invention is a device for measuring the photoelectric performance of photoelectric conversion materials and devices, in particular a test instrument for the photoelectric conversion performance of photoelectrochemical solar cells. Background technique [0002] There are two-electrode and three-electrode methods for testing the photoelectric characteristics of photoelectric conversion materials and devices (such as photovoltaic cells), and the two-electrode method is more commonly used. What has been reported are discrete devices assembled by some research institutions themselves. A pulsed xenon (Xe) lamp is used to simulate the sun light source to irradiate the photovoltaic cell, and the performance parameters of the photovoltaic cell are obtained by comparing the voltage and current data of the photovoltaic cell under the irradiation of the simulated light source with the measurement data of the standard photovoltaic cel...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26H01L31/04G01M11/00G01N21/00G01R31/00H02S50/15
CPCY02E10/50
Inventor 李康孙岳明马春光袁春伟
Owner SOUTHEAST UNIV
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