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Electronic component test method, test equipment and intelligent lock

A technology of electronic components and testing methods, which is applied in the field of electronic component testing, and can solve problems such as excessive sound decibels, inability to test working effectiveness, and low brightness of light-emitting devices.

Pending Publication Date: 2022-03-04
GUANGDONG MINGMEN LOCKS IND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the effectiveness of its work cannot be further identified
For example, the decibels of the sound emitted by the sound-generating device are too large or too small, and there are noises, popping sounds, etc.; the brightness of the light emitting device is too low or too high
In other words, the traditional test procedure can only test whether the acousto-optic devices work, but cannot test the effectiveness of the work, resulting in the failure of some abnormal devices in the electronic smart lock to be identified quickly and in time

Method used

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  • Electronic component test method, test equipment and intelligent lock
  • Electronic component test method, test equipment and intelligent lock
  • Electronic component test method, test equipment and intelligent lock

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0048] Such as figure 1 As described, in this embodiment, a method for testing electronic components is provided, including the following steps:

[0049] Step S11 , sending an instruction to the component to make the component enter a working state.

[0050] There are many kinds of components in the smart lock. In this embodiment, the sounding device and the light emitting device are taken as examples to describe the testing method of the electronic components.

[0051] The components in this step include the components to be tested and the calibration components that are the same type as the components to be tested and can work effectively. In other words, in this step, the above instructions are sent to the two components. Among them, the components that are the same model as the components to be tested and can work effectively are used as calibration components to assist in testing the working status of the components to be tested.

[0052] When testing the sound-generati...

Embodiment 2

[0083] Such as figure 2 As described, in this embodiment, a method for testing electronic components is provided, including the following steps:

[0084] Step S21 , sending an instruction to the component to make the component enter a working state.

[0085] There are many kinds of components in the smart lock. In this embodiment, the sounding device and the light emitting device are taken as examples to describe the testing method of the electronic components.

[0086] The components in this step include the components to be tested and the calibration components that are the same type as the components to be tested and can work effectively. In other words, in this step, the above instructions are sent to the two components. Among them, the components that are the same model as the components to be tested and can work effectively are used as calibration components to assist in testing the working status of the components to be tested.

[0087] When testing the sound-generat...

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PUM

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Abstract

The invention relates to the technical field of electronic component testing, and provides an electronic component testing method, which comprises the following steps: acquiring current data of a to-be-tested component when executing a preset instruction, comparing the current data with current data of a calibration component when executing the preset instruction, and analyzing the difference between the current data and the current data to judge the working state of the to-be-tested component. Whether the to-be-tested component can work normally or not can be obtained, and whether the to-be-tested component can work effectively or not can also be obtained.

Description

technical field [0001] The present invention relates to the technical field of testing electronic components, in particular to a testing method for electronic components, testing equipment and an intelligent lock. Background technique [0002] Compared with traditional mechanical locks, electronic smart locks introduce a variety of identification methods, the most common ones include magnetic cards, fingerprints, passwords, and face recognition. For electronic smart locks, light-emitting devices and / or sound-emitting devices need to be provided to prompt the opening and closing and operating status of the lock body. During the use of electronic smart locks, if the relevant acousto-optic devices fail, it will affect the user's judgment on the state of the lock body and reduce the safety performance of the lock body. Therefore, a test program is usually set up in the electronic smart lock to test whether the function of the acousto-optic device is normal. Make a sound, and w...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G07C9/00
CPCG01R31/00G07C9/00174
Inventor 陈怡威
Owner GUANGDONG MINGMEN LOCKS IND