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Method, device and equipment for estimating service life of consumables in test and medium

A technology for consumables and lifespan, which is applied in the field of memory module production and testing, and can solve problems such as reduced memory module testing efficiency.

Pending Publication Date: 2022-03-11
SHENZHEN TIGO SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention provides a method, device, equipment and medium for estimating the life of consumables in testing, so as to solve the problem of replacing the main board and the adapter board when other consumables such as the main board and the adapter board are damaged in the prior art Other consumables will reduce the efficiency of memory stick testing

Method used

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  • Method, device and equipment for estimating service life of consumables in test and medium
  • Method, device and equipment for estimating service life of consumables in test and medium
  • Method, device and equipment for estimating service life of consumables in test and medium

Examples

Experimental program
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Embodiment 1

[0048] see figure 1 , combined with figure 2 as shown, figure 1 It is a schematic flowchart of a method for estimating the life of consumables under test provided by Embodiment 1 of the present invention. The method can be applied to a processor, and the processor includes a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory complete mutual communication through the communication bus, which is not specifically limited in the present invention. Specifically, such as figure 1 As shown, the method includes the following steps S101-S104.

[0049] S101, test the consumables, and obtain the test results of the consumables.

[0050] The processor accepts the test result of the memory stick uploaded by the memory stick test machine, and when the test result of the memory stick is an abnormal result, the processor determines that the memory stick whose test result is an abnormal result is an a...

Embodiment 2

[0075] see image 3 , image 3 It is a schematic flowchart of a method for estimating the life of consumables under test provided by Embodiment 2 of the present invention. The method for estimating the service life of consumables under test in Embodiment 2 includes steps S201-S212, wherein steps S201-S204 are similar to steps S101-S104 in Embodiment 1 above, and will not be repeated here. The steps S205-S212 added in this embodiment will be described in detail below.

[0076] Before said testing the consumables and obtaining the test results of the consumables, it also includes:

[0077] S205. Obtain the test result of the memory stick.

[0078] S206. If the test result of the memory stick is an abnormal result, determine that the memory stick is an abnormal memory stick.

[0079] S207. Obtain consumables corresponding to the abnormal memory stick.

[0080] The processor obtains the test result of the memory stick uploaded by the memory stick test machine, and when the te...

Embodiment 3

[0094] see Figure 4 , the embodiment of the present invention also provides a life estimation device 400 for consumables under test, the life estimation device 400 for consumables under test includes a first test unit 401, a first determination unit 402, and a first acquisition unit 403 , the first estimation unit 404 .

[0095] The first testing unit 401 is configured to test consumables and obtain test results of the consumables;

[0096] The first determination unit 402 is configured to determine that the consumable is an abnormal consumable if the test result of the consumable is an abnormal result;

[0097] The first acquiring unit 403 is configured to acquire the usage time values ​​of a plurality of abnormal consumables and a correlation model among the plurality of abnormal consumables;

[0098] The first estimation unit 404 is configured to obtain the life threshold of the consumables according to the correlation model among the plurality of abnormal consumables an...

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Abstract

The invention relates to a method, a device, equipment and a medium for estimating the service life of consumables in a test, and relates to the field of memory bank production test mass production, and the method comprises the following steps: testing the consumables to obtain test results of the consumables; if the test result of the consumables is an abnormal result, judging that the consumables are abnormal consumables; obtaining use time values of the plurality of abnormal consumables and obtaining a correlation model among the plurality of abnormal consumables; and according to the correlation model among the plurality of abnormal consumables and the use time values of the plurality of abnormal consumables, estimating the life threshold of the consumables. According to the correlation model among the plurality of abnormal consumables and the use time values of the plurality of abnormal consumables, the service life threshold value of the consumables is obtained, and the consumables can be replaced in advance before the consumables reach the service life threshold value. And the problem that the memory bank test efficiency is reduced due to replacement of the damaged consumables is avoided.

Description

technical field [0001] The present invention relates to the field of production test mass production of memory sticks, in particular to a method, device, equipment and medium for life estimation of consumables in test. Background technique [0002] During the production and testing process of the memory stick, the main board and adapter board used for testing will have a life limit. When the test alarm instrument alarms, it cannot be judged that the cause of the alarm is due to the main board and the adapter board inserted into the memory stick. If there is a problem with other consumables or the quality of the memory stick itself, since it is impossible to know the life of other consumables such as the main board and the adapter board, we can only detect other consumables such as the main board and the adapter board when the alarm instrument is alarmed. In order to check whether it is the cause of the damage of other consumables such as the main board and the adapter board,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/27G06N3/04G06N3/08G06F119/02
CPCG06F30/27G06N3/04G06N3/08G06F2119/02
Inventor 李创锋
Owner SHENZHEN TIGO SEMICON