Method and device for measuring normalized noise exposure level
A measurement method and normalization technology, applied in the direction of measuring devices, measuring electrical variables, measuring current/voltage, etc., can solve problems such as low accuracy and deviation of measurement results, and achieve the effect of improving prediction accuracy
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[0032] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.
[0033] This application provides a method for determining the normalized noise exposure level.
[0034] The method for determining the normalized noise exposure level provided in this application does not limit its executive body. Optionally, the executor of the method for measuring the normalized noise exposure level provided in this application may be a device for measuring the normalized noise exposure level.
[0035] Specifically, the executor may be a single-chip microcomputer in the device for measuring the normalized noise exposure level.
[0036] Such as figure ...
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