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Calibration adapter board of high-speed digital integrated circuit test system

A technology of integrated circuits and test systems, applied in the field of calibration of integrated circuit test systems, can solve problems such as test board influence, failure to meet accuracy requirements, lack of calibration accuracy, etc., to achieve the effect of increasing versatility and meeting calibration accuracy

Pending Publication Date: 2022-04-01
NO 709 RES INST OF CHINA SHIPBUILDING IND CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the test work of the integrated circuit test system, the integrated circuit chip must be loaded on the test board to be tested. Therefore, if the test board is removed to calibrate the integrated circuit test system, the calibration accuracy will be affected due to the absence of the test board.
Especially when calibrating high-speed digital integrated circuit test systems, the requirements for accuracy are higher, and the current calibration methods cannot meet their requirements for accuracy

Method used

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  • Calibration adapter board of high-speed digital integrated circuit test system
  • Calibration adapter board of high-speed digital integrated circuit test system
  • Calibration adapter board of high-speed digital integrated circuit test system

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Embodiment Construction

[0021] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0022] The invention provides a calibration adapter board for a high-speed digital integrated circuit test system, such as figure 1 As shown, the calibration adapter board 2 has a signal connection channel consistent with the signal channel of the test fixture 1 on the test board of the high-speed digital integrated circuit test system, so that the calibration adapter board 2 can be directly installed and docked with the test fixture 1, Complete the construction of the calibration signal channel to meet the calibration accuracy of the high-speed digital integrated circuit test system, and save the work of disassembling and assembling the test board (including test fi...

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Abstract

The invention provides a calibration adapter plate of a high-speed digital integrated circuit test system, and the calibration adapter plate is provided with a signal butt joint channel which is consistent with a signal channel on a test plate of the high-speed digital integrated circuit test system, so that the calibration adapter plate can be directly installed and butt-jointed with a test clamp on the test plate. According to the calibration adapter plate, the calibration signal channel is constructed, so that the calibration precision requirement of the high-speed digital integrated circuit test system is met, the work of disassembling and assembling a test plate (including a clamp) from the integrated circuit test system is omitted, and meanwhile, the universality of the calibration adapter plate to different integrated circuit test systems is also improved.

Description

technical field [0001] The invention relates to the technical field of calibration of integrated circuit test systems, in particular to a calibration adapter board for a high-speed digital integrated circuit test system. Background technique [0002] At present, in the calibration work of the integrated circuit test system, it is necessary to disassemble the test board of the integrated circuit test system, and then install the calibration adapter board on the signal interface board of the integrated circuit test system for calibration. However, in the test work of the integrated circuit test system, the integrated circuit chip must be loaded on the test board to be tested. Therefore, if the test board is removed to calibrate the integrated circuit test system, the calibration accuracy will be affected due to the absence of the test board. Especially when calibrating the high-speed digital integrated circuit test system, the requirements for accuracy are higher, and the curr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/303G01R1/04
Inventor 顾翼刘文捷石坚周厚平张明虎丁超
Owner NO 709 RES INST OF CHINA SHIPBUILDING IND CORP