Electronic device and method of inspecting electronic device
An electronic device, a technique for checking signals, used in measuring devices, measuring resistance/reactance/impedance, circuits, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0051] In the present disclosure, it will be understood that when an element or layer is referred to as being "on," "connected to," or "coupled to" another element or layer, the element or layer A layer may be directly on, directly connected to, or directly coupled to the other element or layer, and / or intervening elements or layers may be present.
[0052] Like references refer to like elements throughout. In the drawings, the thickness, proportions, and sizes of components are exaggerated in order to effectively describe technical contents. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.
[0053] It will be understood that although the terms first, second, etc. may be used herein to describe various elements, components, regions, layers and / or sections, these elements, components, regions, layers and / or sections should not be constrained by these Terminology Limitations. These terms are only used to distin...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com