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Pseudo-random speckle-based three-dimensional measurement system, method and device

A three-dimensional measurement, pseudo-random technology, applied in the field of optical measurement, can solve the problems of low measurement accuracy, low detection efficiency, slow processing speed, etc., and achieve the effect of solving low measurement accuracy

Pending Publication Date: 2022-05-13
SHENZHEN EAGLE EYE ONLINE ELECTRONICS TECH
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  • Claims
  • Application Information

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Problems solved by technology

[0005] In view of the deficiencies in the prior art above, the purpose of this application is to provide a three-dimensional measurement system based on pseudo-random speckle, which aims to solve the problems of low measurement accuracy and processing Problems such as slow speed and low detection efficiency

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  • Pseudo-random speckle-based three-dimensional measurement system, method and device

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Embodiment Construction

[0036] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Preferred embodiments of the application are shown in the accompanying drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the application more thorough and comprehensive.

[0037] The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments that the present application can be used to implement. The serial numbers assigned to components in this document, such as "first", "second", etc., are only used to distinguish the described objects, and do not have any sequence or technical meaning. The "connection" and "connection" mentioned in this application all include direc...

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Abstract

The invention relates to a pseudo-random speckle-based three-dimensional measurement system, which comprises an image acquisition device, an image preprocessing device, a system calibration device, a height calculation device and a three-dimensional data processing device, and is characterized in that the image acquisition device acquires a speckle image of a reference plane and a speckle image of a to-be-measured target surface; the image preprocessing device carries out image processing according to the speckle image of the reference datum plane and the speckle image of the surface of the to-be-measured target; the system calibration device obtains calibration parameters according to the speckle image of the reference datum plane; the height calculation device obtains a corresponding centroid offset according to the processed speckle image of the reference datum plane and the processed speckle image of the surface of the target to be measured; and the three-dimensional data processing device obtains three-dimensional contour information of the to-be-measured target surface according to the height value of each speckle point relative to the reference datum plane. The invention further discloses a three-dimensional measurement method based on the pseudo-random speckles and a three-dimensional measurement device based on the pseudo-random speckles.

Description

technical field [0001] The present application relates to the field of optical measurement technology, in particular to a three-dimensional (3-Dimension, 3D) measurement system based on pseudo-random speckle, a three-dimensional measurement method based on pseudo-random speckle, and a three-dimensional measurement method based on pseudo-random speckle. measuring device. Background technique [0002] Compared with traditional two-dimensional image information, three-dimensional information can more comprehensively and truly reflect objective objects, and realize many detection requirements that traditional two-dimensional image information cannot meet, such as: measuring height, depth, thickness, flatness, warpage degrees, wear and scratches, etc. With the continuous iteration of industrial development, many 3D measurement technologies are becoming more and more mature. Among them, due to the non-contact, high-precision, high-efficiency, and strong anti-interference charact...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06G01B11/24
CPCG01B11/0608G01B11/24
Inventor 雷志辉陈状刘宇熊祥祥丁华轩傅丹
Owner SHENZHEN EAGLE EYE ONLINE ELECTRONICS TECH