A kind of dynamic grating pattern generation method and system for 3D measurement

A dynamic grating and pattern technology, applied in the field of optics and electronics, can solve the problems of complex system, low optical utilization rate, low brightness, etc.

Active Publication Date: 2022-07-26
杭州灵西机器人智能科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. The system is complex and costly;
[0005] 2. Low optical utilization;
[0006] 3. In the case of limited volume, the brightness is low. At the same time, because the projector only blocks the light in the low gray area, or reflects it to another, but the light source at the corresponding position is always on, so the dynamic contrast is not high.
[0007] In the prior art, there is no better dynamic pattern generation scheme that can replace multi-purpose projectors that can produce higher contrast, measurement accuracy and resolution

Method used

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  • A kind of dynamic grating pattern generation method and system for 3D measurement
  • A kind of dynamic grating pattern generation method and system for 3D measurement
  • A kind of dynamic grating pattern generation method and system for 3D measurement

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Embodiment 1

[0059] as attached figure 1 to the attached Image 6 As shown, an embodiment of the present invention provides a dynamic grating pattern generation system for 3D measurement, including a light-emitting unit array 1 for emitting high-frequency stroboscopic light, and the light-emitting unit array 1 includes a number of parallel and spaced light-emitting units 11. Each light-emitting unit 11 can be independently controlled, and the number of light-emitting units 11 can be 50, 100, etc. The specific number is set according to the required resolution.

[0060] Define the plane where the light-emitting unit array 1 is located as the reference plane, with the X-axis direction and the Y-axis direction perpendicular to each other, and define the light propagation path as the Z-axis direction;

[0061] a lens array, arranged on the light propagation path, for focusing the light in the Y-axis direction, the lens array includes a plurality of lens units, and each lens unit corresponds t...

Embodiment 2

[0085] The difference between this embodiment and the first embodiment is that, as shown in the appendix Figure 7 As shown, a first optical element 7 is added in the light propagation path. The first optical element 7 is located between the lens array and the grating shaping array 3, and is used to collimate the light in the X-axis direction. The first optical element 7 can be A single cylindrical lens, or a group of cylindrical lenses, or a DOE (diffractive optical element).

[0086] In this embodiment, the light-emitting units 11 in the light-emitting unit array 1 are one or more point light sources or line light sources along the X-axis direction.

[0087] In order to ensure that the projected pattern on the working surface is in the shape of a grating strip, the length of the collimated beam should be greater than the length L of the light-transmitting area 31 in the grating shaping array 3 . When the light-emitting unit is a point light source, the focal length f of the...

Embodiment 3

[0091] The difference between this embodiment and the first embodiment is that, as shown in the appendix Figure 8 As shown, a second optical element 8 is added in the light propagation path. The second optical element 8 is located between the lens array and the grating shaping array 3 to change the divergence angle of the light in the X-axis direction, thereby controlling the working surface 6 The length of the projected pattern on the X axis. The second optical element 8 may be a single cylindrical lens, or a group of cylindrical lenses, or a DOE (Diffractive Optical Element).

[0092] Since the second optical element is added to constrain the divergence angle of light in the X-axis direction, the projection lens 5 in this embodiment can be composed of a cylindrical mirror, and only focuses the light beam passing through the grating shaping array 3 in the Y-axis direction, so that the The resulting grating strips are focused on the working surface 6 without changing the pro...

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Abstract

The invention relates to a method and system for generating a dynamic grating pattern for 3D measurement. Light emitted by a light-emitting unit array is collected by a lens array into a grating shaping array. After the light passes through the grating shaping array, a beam deflection mechanism generates a Y-axis direction. The beam on the screen is translated, and then passes through the projection lens and is projected onto the work surface. The projected structured light pattern is generated by the grating shaping array, and the number of switching changes and strobes is independently controlled by a number of light-emitting units arranged in parallel and spaced in the light-emitting unit array, and the rotation of the beam deflection mechanism produces the brightness generated by the combined action. A grating fringe pattern that varies along the Y-axis. Specifically, the light-emitting unit array determines the brightness of the grating strips in the projection pattern through the stroboscopic frequency of the light source, controls the precision of the element pattern through the grating shaping array, and controls the resolution of the projection pattern through the beam deflection mechanism and the stroboscopic frequency of the light-emitting unit, so that A dynamic grating pattern is formed on the work surface.

Description

technical field [0001] The present invention relates to the fields of optics and electronics, and in particular, to a method and system for generating dynamic grating patterns for 3D measurement. Background technique [0002] 3D measurement is being used more and more widely in various fields because it can obtain depth information of objects. 3D measurement can be divided into line scanning method and surface scanning method according to the technical principle. The surface scanning method is fast, efficient, and has more application prospects. The 3D measurement in the area scanning method generally needs to project structured light to the object, and use the camera to capture the pattern to calculate the 3D point cloud data. The projected structured light is a specific pattern, such as a speckle pattern. [0003] If the projected structured light is a speckle pattern, only one picture is needed, but the measurement accuracy is not high. For scenes with high measurement...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B27/09G02B27/00G02B26/08
CPCG02B27/0944G02B27/00G02B26/0875
Inventor 王灿丁丁
Owner 杭州灵西机器人智能科技有限公司
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