A kind of dynamic grating pattern generation method and system for 3D measurement

A dynamic grating and pattern technology, applied in the field of optics and electronics, can solve the problems of complex system, low optical utilization rate, low brightness, etc.
CN114509879BActive Publication Date: 2022-07-26杭州灵西机器人智能科技有限公司
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
杭州灵西机器人智能科技有限公司
Publication Date
2022-07-26

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Abstract

The invention relates to a method and system for generating a dynamic grating pattern for 3D measurement. Light emitted by a light-emitting unit array is collected by a lens array into a grating shaping array. After the light passes through the grating shaping array, a beam deflection mechanism generates a Y-axis direction. The beam on the screen is translated, and then passes through the projection lens and is projected onto the work surface. The projected structured light pattern is generated by the grating shaping array, and the number of switching changes and strobes is independently controlled by a number of light-emitting units arranged in parallel and spaced in the light-emitting unit array, and the rotation of the beam deflection mechanism produces the brightness generated by the combined action. A grating fringe pattern that varies along the Y-axis. Specifically, the light-emitting unit array determines the brightness of the grating strips in the projection pattern through the stroboscopic frequency of the light source, controls the precision of the element pattern through the grating shaping array, and controls the resolution of the projection pattern through the beam deflection mechanism and the stroboscopic frequency of the light-emitting unit, so that A dynamic grating pattern is formed on the work surface.
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Description

technical field

[0001] The present invention relates to the fields of optics and electronics, and in particular, to a method and system for generating dynamic grating patterns for 3D measurement. Background technique

[0002] 3D measurement is being used more and more widely in various fields because it can obtain depth information of objects. 3D measurement can be divided into line scanning method and surface scanning method according to the technical principle. The surface scanning method is fast, efficient, and has more application prospects. The 3D measurement in the area scanning method generally needs to project structured light to the object, and use the camera to capture the pattern to calculate the 3D point cloud data. The projected structured light is a specific pattern, such as a speckle pattern.

[0003] If the projected structured light is a speckle pattern, only one picture is needed, but the measurement accuracy is not high. For scenes with high measurement...

Claims

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