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424 results about "Grating pattern" patented technology

Method and apparatus for the determination of mask rules using scatterometry

A method and apparatus for determining optical mask corrections for photolithography. A plurality of grating patterns is printed onto a wafer utilizing a photomask having at least one grating. Each grating pattern within the plurality of grating patterns is associated with known photolithographic settings. Each grating pattern is illuminated independently with a light source, so that light is diffracted off each grating pattern. The diffracted light is measured utilizing scatterometry techniques to determine measured diffracted values. The measured diffracted values are compared to values in a library to determine a profile match. A 2-dimensional profile description is assigned to each grating pattern based on the profile match. A database is compiled of the profile descriptions for the plurality of grating patterns. Photomask design rules are then generated by accessing the database containing the 2-dimensional profile descriptions. In preferred embodiments, the design rules are used to create and correct masks containing OPC corrections, phase-shifting mask corrections and binary masks. In a preferred embodiment the at least one grating is a bi-periodic grating. In a preferred embodiment, the scatterometry technique is optical digital profilometry utilizing a reflectometer or ellipsometer.
Owner:TOKYO ELECTRON US HOLDINGS INC

Fringe projection time phase unwrapping method based on deep learning

The invention discloses a fringe projection time phase unwrapping method based on deep learning. Firstly, four sets of three-step phase shift grating patterns are projected to a to-be-tested object, the frequencies are 1, 8, 32 and 64 respectively, and a camera collects a raster image and obtains a wrapped phase image by using a three-step phase shift method; then, a multi-frequency algorithm based on time phase unwrapping is used for carrying out phase unwrapping on the wrapped phase image to obtain a periodic level map of a phase with the frequency of 64; a residual convolutional neural network is constructed; the input data is set to be the wrapped phase image with the frequencies of 1 and 64, and the output data is the periodic level map of the phase with the frequency of 64; finally,a training set and a verification set are made to train and verify the network; and the network verifies a test set to output the periodic level map of the phase with the frequency of 64. According tothe fringe projection time phase unwrapping method based on deep learning in the invention, the deep learning method is adopted and the wrapped phase image with the frequency of 1 is used for unwrapping the wrapped phase image with the frequency of 64; and an absolute phase image with less error points and higher accuracy can be obtained.
Owner:NANJING UNIV OF SCI & TECH

Method and apparatus for the determination of mask rules using scatterometry

A method and apparatus for determining optical mask corrections for photolithography. A plurality of grating patterns is printed onto a wafer utilizing a photomask having at least one grating. Each grating pattern within the plurality of grating patterns is associated with known photolithographic settings. Each grating pattern is illuminated independently with a light source, so that light is diffracted off each grating pattern. The diffracted light is measured utilizing scatterometry techniques to determine measured diffracted values. The measured diffracted values are compared to values in a library to determine a profile match. A 2-dimensional profile description is assigned to each grating pattern based on the profile match. A database is compiled of the profile descriptions for the plurality of grating patterns. Photomask design rules are then generated by accessing the database containing the 2-dimensional profile descriptions. In preferred embodiments, the design rules are used to create and correct masks containing OPC corrections, phase-shifting mask corrections and binary masks. In a preferred embodiment the at least one grating is a bi-periodic grating. In a preferred embodiment, the scatterometry technique is optical digital profilometry utilizing a reflectometer or ellipsometer.
Owner:TOKYO ELECTRON US HOLDINGS INC

16-step dual-frequency grating phase shift profilometry capable of absolute phase unwrapping

InactiveCN101655360AGuaranteed measurement accuracyGuaranteed Measurement RequirementsUsing optical meansMeasurement studyThree dimensional shape
The invention provides 16-step dual-frequency grating phase shift profilometry capable of absolute phase unwrapping in the three-dimensional sensor technology. The invention is characterized by usingcomputers to design codes to generate 16 dual-frequency grating patterns, using a digital light projector to image the grating patterns on the surface of an object instantaneously in sequence, using apick-up device to record the deforming fringe pattern of the object, subsequently using the functional relationship between the gratings with two frequencies, using the absolute phase unwrapping method to directly realize phase unwrapping of point to point in the whole field range and having no relation with the path for phase unwrapping, effectively inhibiting accumulative error diffusion, usingphase measuring profilometry to process the deforming fringes, accurately restoring the three-dimensional shape of the object and obtaining such digital information as deformation of the object and the like by further analyzing the data processing results. The method can be used for measurement study of the characteristics of the object surface with the characteristic of diffuse reflection. The method has the advantages of high measurement precision and strong adaptability to the surface topography of the object, etc.
Owner:SICHUAN UNIV

Coating capable of repetitively copying and transferring molding grating pattern and template film including the same

The invention provides a coating which can repeatedly reproduce and transfer grating patterns obtained by mould pressing to the surface of a printing stock. The coating comprises the weight components: 30-40% of modified acrylic resin, 10-25% of firming agent, 0.15-0.5% of catalyzer and 40-55% of solvent; wherein, the modified acrylic resin comprises acrylic resin or DHMP, acylic acid hydroxy ester, epoxide resin, organic silicon resin containing hydroxide radical, evocating agent and solvent. The coating has suitable mould pressing strength, good surface compactness, difficult permeable solvent and low surface tension, still has clear grating pattern after mould pressing in the situation of repeated peeling. The invention also provides a template membrane which can repeatedly reproduce and transfer the grating patterns obtained by mould pressing; the template membrane comprises a base membrane and the coating fixedly overlaid on the base membrane. The coating forms the grating patterns by mould pressing. The template membrane can continuously reproduce the grating patterns to the printing stocks such as papers or plastic glass and the like by only a primary mould pressing by releasing layers or adhesive layers, thus saving working procedures and greatly reducing production costs.
Owner:汕头市龙湖昌丰化工有限公司
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