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1210results about How to "Reduce scatter" patented technology

Near-infrared laser scanning confocal imaging system

The invention discloses a near-infrared laser scanning confocal imaging system, which comprises a light path scanning unit and a control unit which adopt a confocal structure, wherein the light path scanning unit comprises a near-infrared laser source, a collimation and extension module, a laser optical filter, a dichroic reflector, a scanning galvanometer, an f-theta lens, a tube lens, an imaging objective lens, a fluorescent optical filter, a convergent lens, a pinhole, a detector and the like, the control unit comprises a motion control module used for controlling the scanning galvanometer, a data acquisition module used for acquiring an output signal of the detector, a data processing module connected with the motion control module and the data acquisition module, and the like. The method matched with the system is characterized in that a sample is marked with near-infrared quantum dots with the fluorescence emission spectrums between 932nm and 1250nm, and then the sample is detected by the near-infrared laser scanning confocal imaging system. According to the system disclosed by the invention, deep-level imaging of samples such as biological tissues can be accurately and efficiently realized, and the system has a simple structure and is easy to operate.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Twinkling transparent ceramics system with garnet structure and preparation method thereof

The invention provides a twinkling transparent ceramics with garnet structure and a preparation method thereof. The twinkling transparent ceramics is characterized in that oxysalt of the garnet structure is taken as substrate, and the structural formula of the garnet structure is 3mR, 3nR': (A(1-m-n-x) A'x)3 (By C(1-y))5 O12, wherein, m and n are more then or equal to 0 and less than or equal to 0.1, x is more than or equal to 0 and less than or equal to 1, and y is more then or equal to 0 and less than or equal to 0.4; one or combination in Ce, Pr, Nd, Sm, Eu, Tb, Dy, Ho, Er, Tm, Yb, Cr, Ti and Mn can be taken as luminous ion. The product uses high-purity material (being more than 99.99%) for high-energy ball milling to process powder by being added with sintering accessory ingredient and combining vacuum sintering, so that the twinkling transparent ceramics with high optical quality can be obtained. In visible light area, the twinkling transparent ceramics has the transmission reaching 80% or above, and the stimulated emission peak is matched with sensitizing range of a photoelectric detector. The twinkling transparent ceramics is a scintillating material having application prospect in the field of detecting high-energy rays (such as electron, alpha and beta particles, x-ray, gamma-ray and the like). The invention can be applied to an electron microscope, a counter, a ray imaging screen and the like, and has the advantages of simple technique, low production cost, etc.
Owner:中科西卡思(苏州)科技发展有限公司

Antenna for reducing radar scattering cross section

The invention discloses an antenna for reducing a radar scattering cross section, aiming to solve the problem of large radar scattering cross section of the traditional microstrip antenna. The antenna comprises a dielectric slab (1), a microstrip radiating unit (2) and an earth plate (3), wherein the microstrip radiating unit is arranged at the upper surface of the dielectric slab, and the earth plate is arranged at the lower surface of the dielectric slab; both sides of the microstrip radiating unit are provided with a high impedance surface array (4) respectively; each high impedance surface array is formed by arranging a plurality of metal chips into a rectangle, a gap is arranged between the adjacent metal chips to form a capacitor C; the center of each metal chip is provided with a metal via hole which penetrates through the dielectric slab; a current path connected by the via holes can form an inductor L, and the capacitor and the inductor form an LC resonant circuit; the frequency of the resonant circuit can be adjusted to be coincident with the working frequency of the antenna, thus realizing scattered field compensation of the high impedance surface array and the antenna. The invention has stable performance of reducing radar scattering cross section within and outside the frequency band of the antenna, and also has no effect on the size, weight and cost of the antenna.
Owner:XIDIAN UNIV

Method for manufacturing triangular groove echelon gratings with 90-degree vertex angles

ActiveCN103901520AMake anyMeet the conditions for perfect sparkleDiffraction gratingsPhotomechanical exposure apparatusBroadbandWave band
The invention provides a method for manufacturing triangular groove echelon gratings with 90-degree vertex angles. Each triangular groove echelon grating is composed of a silicon grating structure (1), photoresist (3) and a metal film (4). A manufactured grating groove is a triangle with the vertex angle being 90 degrees, so that the diffraction efficiency higher than that of an echelon grating with the vertex angle being not 90 degrees can be achieved. Each grating structure is produced in an obliquely-cut monocrystalline wafer, the shining angles of the gratings are determined by an obliquely-cut angle for cutting each silicon wafer, and gratings with any blazing angles can be manufactured; according to the 90-degree vertex angles, grooves of silicon gratings with the vertex angles being not 90 degrees are filled with photoresist, then photoetching is conducted again, and the original silicon gratings with the vertex angles being not 90 degrees are converted into the triangular groove gratings with the vertex angles being 90 degrees. According to the manufactured grating structure, the shining face of each grating is a smooth monocrystal silicon <111> grate plane, scattering can be effectively lowered, and the diffraction efficiency of each grating is improved. The purpose that all the gratings have high diffraction efficiency on a broadband is achieved according to the fact that using wave bands can choose to be coated with various different reflecting film layers on the surfaces of the gratings.
Owner:UNIV OF SCI & TECH OF CHINA

Automatic positioning method and system for cable local discharge single end of OWTS (Oscillating Wave Test System) detection device

ActiveCN102435924AReduce the presence of scatterPositioning analysis results are accurateTesting dielectric strengthFault locationWave crestTime difference
The invention discloses an automatic positioning method for a cable local discharge single end of an OWTS (Oscillating Wave Test System) detection device. The automatic positioning method comprises the following steps of: extracting a positioning parameter containing positioning information from test data saved in an OWTS local discharge detection device; enabling the positioning parameter to generate a graph of sampling points; respectively setting waveform sections corresponding to wave crests in the graph as original pulses; then searching the waveforms matched with the original pulses from the graph; calculating the time difference between the wave crests matched with the waveforms and the wave crests of the original pulse; and calculating the position of a fault according to the time difference. The invention also provides an automatic positioning system for the cable local discharge single end of the OWTS detection device. By using the technology disclosed by the invention, the fault pointing result of the cable is more intensive and scatter points are reduced, so that more accurate positioning analysis result is obtained, automatic analyzing and positioning can be carried out and costs of labor consumption and positioning are reduced.
Owner:GUANGZHOU POWER SUPPLY BUREAU GUANGDONG POWER GRID CO LTD +1

Color film substrate and display device

The embodiment of the invention provides a color film substrate and a display device, and relates to the technical field of display. The efficient light filtering effect can be achieved, and the backlight utilization rate is increased. The color film substrate comprises multiple pixel units. Each pixel unit comprises a blue sub-pixel, a green sub-pixel and a red sub-pixel. Each blue sub-pixel comprises a first photonic crystal layer on a substrate body and used for making blue light emitted to the color film substrate to pass. Each green sub-pixel comprises a second photonic crystal layer and a first light emitting medium layer which are arranged on the substrate body in sequence, wherein the first light emitting medium layer emits green light under the stimulation of the blue light, and the second photonic crystal layer is used for making the green light to pass. Each red sub-pixel comprises a third photonic crystal layer and a second light emitting medium layer which are sequentially arranged on the substrate body in sequence, wherein the second light emitting medium layer emits red light under the stimulation of the blue light, and the third photonic crystal layer is used for making the red light to pass. The invention further provides a preparation method for the color film substrate and the display device with the color film substrate.
Owner:BOE TECH GRP CO LTD

Microwave anechoic chamber performance measuring method

ActiveCN103051399ACross-polarization feature implementationLoss uniformity achievedElectrical measurementsTransmission monitoringPerformance indexCross polarization
The invention provides a microwave anechoic chamber performance measuring method, which comprises the following steps of: adopting a microwave anechoic chamber performance measuring system, and setting a dead zone parameter, a measuring frequency, a signal source power, a scanning trace and a kinematic velocity of a receiving antenna, and a rotation direction and a rotation velocity of a transceiving antenna according to the requirements of a microwave anechoic chamber performance analysis test; driving a signal source according to the signal source power; driving each stepping motor to control each moving part to move according to the scanning trace and the kinematic velocity of the receiving antenna, and the rotation direction and the rotation velocity of the transceiving antenna; and controlling a signal receiver to receive a signal of the receiving antenna according to the measuring frequency, and storing the signal. The method can be adopted to be applied in a microwave anechoic chamber flexibly so as to measure along different scanning traces; and a computer is adopted to realize automatic measurement of microwave anechoic chamber dead zone reflectivity level, cross polarization character, multi-path loss uniformity, and field uniformity performance indexes, so that the measuring efficiency is improved.
Owner:CHINA SHIP DEV & DESIGN CENT
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