Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

3 results about "State density" patented technology

In 2018, the population density was approximately 92.6 residents per square mile of land area. Population density in the United States. Population density has been tracked for over two hundred years in the United States.

Stress-containing energy band and state density rapid calculation method based on kp method

The invention discloses a kp method-based stress-containing energy band and state density rapid calculation method, and belongs to the technical field of semiconductor device simulation. The method comprises the following steps: acquiring a k-point coordinate and a stress tensor of a target semiconductor material, and constructing a Hamiltonian matrix containing a stress item based on a kp method; by using the symmetry and energy band degeneracy characteristic of a kp method, matrix eigenvalue solving is converted into a one-element cubic equation rooting problem; the equation is solved to obtain energy band energy information, and energy band calculation is completed; calculating the state density, constructing a cubic unary equation taking a k vector as an independent variable, and solving to obtain k vector information corresponding to the isoenergy surface. According to the method, a pre-query table does not need to be constructed, on the premise that the calculation precision is not changed, the energy band calculation efficiency is improved, the speed of finding an isoenergetic surface in state density calculation is increased, the problems that a traditional method is low in calculation speed, large in storage occupation and limited in stress range are effectively solved, and the method is suitable for simulation of various semiconductor materials and various devices containing stress models.
Owner:SUZHOU COGENDA ELECTRONICS CO LTD

A quantum computing method and system for local state density of materials

PendingCN122314181AAvoid exponential problemsQuantum circuitQuantum entanglement
This invention discloses a quantum computing method and system for calculating the local density of states (LDOS) of materials. The method includes: preparing an initial state for an auxiliary qubit to obtain a first superposition state; generating a random state for a data qubit to obtain a random quantum state; evolving to obtain a quantum entangled state one between the auxiliary qubit and the data qubit; performing a QFT transformation on the auxiliary qubit to obtain a quantum entangled state two and measuring it; if the measurement result is a zero state, the data qubit collapses into a quasi-eigenstate; mapping the probability distribution to the material's real space lattice to obtain the local density of states. The system includes a spectral range acquisition module, an energy sampling module, a quantum circuit generation module, a quantum execution module, and a data analysis and mapping module. This invention, through the execution of a single quantum circuit, parallelly completes the superposition and interference of all possible time evolutions, fundamentally avoiding the exponential problem in classical computing, and providing exponential acceleration potential for large-scale material-informed LDOS calculations.
Owner:YANGTZE DELTA IND INNOVATION CENT OF QUANTUM SCI & TECH

Device interface state density and distribution extraction method, device and equipment

The invention discloses a device interface state density and distribution extraction method, device and equipment, relates to the technical field of semiconductor device interface state characterization, and is used for solving the problems of insufficient precision and insufficient spatial analysis capability in the existing interface state characterization method. Comprising the following steps: establishing a physical model representing intrinsic electrical behaviors of a device, performing calibration to obtain a reference model, and determining carrier transport characteristic parameters; based on the reference model, analyzing the carrier mobility change caused by the interface state as a coulomb scattering center, and determining the density of the interface state; a transistor channel is equivalently discretized into a plurality of ballistic transmission units in the spatial dimension, and the non-uniform spatial distribution characteristic of an interface state in the channel is quantitatively represented according to carrier transport characteristic parameters and interface state density. According to the technical scheme provided by the invention, the density of the interface state can be accurately quantified, the spatial distribution of the interface state can be represented, and the accuracy and comprehensiveness of interface state representation are improved.
Owner:SEMICON TECH INNOVATION CENT(BEIJING) CORP +1