33 results about "Pulse irradiation" patented technology

The invention discloses an accurate X-ray radiation dose measurement system based on artificial intelligence, which comprises the following steps: acquiring CT image data of a patient and pulse irradiation parameters of radiotherapy equipment through terminal equipment, and calculating a patient specific anatomical structure dynamic influence factor set, a pulse waveform time domain characteristic factor and a tissue interface scattering correction factor; all the parameters are substituted into a dose measurement formula to obtain an accurate X-ray radiation dose value; through a deep fusion image recognition technology (such as a high-resolution anatomical structure, tissue density gradient and heterogeneous region distribution provided by CT / MRI), a secondary particle scattering effect of a junction region of a tumor and a normal tissue can be accurately represented; and dynamic anatomical information (such as respiratory movement and organ displacement) in the image is combined to correct the time characteristic (such as dynamic change under an instantaneous high dose rate) of the pulse radiation field in real time, so that the dose calculation accuracy of a fast algorithm in a complex scene is remarkably improved.

The invention relates to a method for pattern recognition to assemble printed circuit boards by digital printing and a system for implementing the method. In the method, pattern recognition techniques are applied to extract information from imaging of the printed circuit board, thereby enabling automated printing of a targeted object on the board. The method comprises digital printing of a material that is uniformly coated on a transparent donor substrate and positioned in parallel to a receiver substrate. A laser pulse irradiates the donor substrate, resulting in detachment and transfer of a portion of the material onto the receiver substrate. The method enables reduction of overall processing time while achieving high alignment accuracy and high printing resolution.

The present invention provides an optical atomic clock system comprising: an optical pulse generation component adapted to generate a clock interrogation optical pulse; the atomic furnace is used for generating atomic steam; each subsystem is suitable for capturing and preliminarily cooling atoms in the received atom steam to obtain a cold atomic group, and is used for trapping the atoms in the cold atomic group; the subsystem is constructed to allow clock polling pulse light to enter, so that atoms in a ground state interfere with each other under the action of two clock polling light pulses; the processing component is used for obtaining an error signal of the subsystem according to the interference result in any subsystem; a timing controller configured to: cause atoms within the at least one subsystem to be in an illumination phase of the clock interrogation light pulse or in a free evolutionary phase between two illumination of the clock interrogation light pulse; the frequency of the clock interrogation light pulse is corrected according to the respective error signals of the plurality of subsystems.

This disclosure aims to compensate for the effects of fluctuations in the repetition frequency of a pulsed light source, which cause distance measurement errors, without using a continuous wave light source. [Solution] The present disclosure relates to a distance measuring device that irradiates an object to be measured with a test light pulse and measures the distance to the object using the interference waveform of the signal light pulse reflected by the object and a reference light pulse, wherein the test light pulse and the reference light pulse have a plurality of frequency components, and the distance measuring device includes a correction signal acquisition unit that detects the interference signal of the test light pulse and the reference light pulse of at least two of the plurality of frequency components contained in the test light pulse and the reference light pulse as a correction signal.

The invention relates to a method for determining a reference time point (t0) by means of a light microscope (1), wherein a sample (2) is illuminated by first light pulses (P1) in order to excite light-emitting entities in the sample (2), wherein a light signal generated by means of the first light pulses (P1) is detected, and wherein the reference time point (t0) is determined based on the detected light signal, and wherein the light signal is detected in at least two measurements each in a first detection time window (G1), wherein a starting time point of the first detection time window (G1) is adjusted for each of the measurements. The invention further relates to a light microscope (1) and a computer program for carrying out the method.

An apparatus (500) for spectroscopic measurements, the apparatus comprising: - an illumination unit (110) for forming narrowband light pulses (B2 t1 , B2 t2 ) having different wavelengths (l1, l2) for illuminating an object (OBJ1) with the narrowband light pulses (B2 t1 , B2 t2 ), - a sensor (SEN1) for detecting light (B3) received from the object (OBJ1), - a control unit (CNT1) for controlling an operation of the sensor (SEN1), wherein the illumination unit (110) comprises: a broadband light source (LS1) for generating broadband light pulses (B1), a Fabry-Perot interferometer (FPI1) for forming the narrowband light pulses (B2) by filtering the broadband light pulses (B1), wherein the broadband light source (LS1) is configured to generate a first broadband light pulse (B1 t1 ) at a first trigger time (t1) and a second broadband light pulse (B1 t2 ) at a second trigger time (t2), wherein the Fabry-Perot interferometer (FPI1) is tunable by moving a mirror (M2) of the Fabry-Perot interferometer, wherein the illumination unit (110) is configured to operate such that the movement of the mirror (M2) does not stop between the first trigger time (t1) and the second trigger time (t2), wherein a start time (t EX1 ) of a first exposure time (Deltat A1 ) and a duration of the first exposure time (Deltat EX1 ) of the sensor (SEN1) are controlled such that the illumination unit (110) forms the first broadband light pulse (B1 EX1 ) and the second broadband light pulse (B1 t1 ) during the first exposure time (Deltat t2 ).

The invention discloses a femtosecond laser directional induction etching system and method based on nanopore anchoring. The system comprises a femtosecond laser, a beam expander L1, a half-wave plate L2, a polarization beam splitter L3, a first reflector L4, a second reflector L5, a long-wave-pass dichroscope L6, a non-polarization beam splitter L7, an infinity correction objective lens L8, a semi-reflecting and semi-transmitting mirror L9, a convex lens L10, a third reflector L11, a sleeve lens L12, a power meter and a CCD camera. And in the multi-pulse irradiation process, by means of the local field enhancement effect, a subsequent structure is induced to be etched in the direction perpendicular to laser polarization with the nanopore as the starting point, and controllable machining of the nanostructure with the line width as low as 15 nm on the surface of the dielectric material is achieved. According to the invention, the growth path of the groove structure is determined by the anchoring position of the nanopore and the polarization direction of the laser, so that the method has good processing control capability and system stability.

To provide an annealing system and a method for avoiding thermal influence on a material and a structure of a lower layer even for a material having poor heat resistance without giving thermal damage to a substrate.SOLUTION: A laser annealing system 10A that anneals a thin film on a substrate by irradiating the thin film with pulsed laser light includes a laser apparatus 12 that outputs pulsed laser light, an emission optical system 70 that is an optical system that emits pulsed laser light to the thin film, and a laser annealing control processor 100 and a laser control processor 28 that are processors that control emission of pulsed laser light to the same location of the thin film by performing burst emission in which a burst period in which the pulsed laser light is continuously emitted and a suppression period in which continuous emission of the pulsed laser light is suppressed are repeated.SELECTED DRAWING: Figure 7

The invention provides methods and apparatus comprising a laser source that uses a single unfocused pulse of a low intensity but high power laser over a large sample area to collect Raman scattered collimated light, which is then Rayleigh filtered and focused using a singlet lens into a stacked fiber bundle connected to a customized spectrograph, which separates the individual spectra from the scattered wavelengths using a hybrid diffraction grating for collection onto spectra-specific sections of an array photodetector to measure spectral intensity and thereby identify one or more compounds in the sample.

A laser therapy device comprises a pulsed laser light source. Each triggering of tissue irradiation causes application of a first heating laser pulse of a first power and a first pulse duration and at least a second heating laser pulse of a second power and a second pulse duration to the tissue. Changes in volume resulting from the rising and the decreasing power gradient of the first laser pulse are detected. The therapy device, on the basis of the measured values relative to the change in volume and taking into consideration at least the predetermined rises of the power gradients of the first heating laser pulse, determines an estimated value for the temperature increase in the tissue during irradiation of the first heating laser pulse, and generates, from the estimated value, a command that causes adjustment of the second power and / or the second pulse duration of the second laser pulse.

The present disclosure relates to a method for detecting a user (U1) approaching a terminal (T1) within a detection distance (D), the method comprising: feeding a LED, by electrical pulses, between an RC circuit connected to a voltage source and a first resistor connected to ground, the LED illuminating a detection zone with light pulses; capturing by a photodiode light pulses coming from the detection zone; determining a pulse count representative of a time-of-flight of a light pulse emitted by the LED and received by the photodiode; computing a count variation by subtracting a reference count from the pulse count, the reference count being determined when no object is present in the detection zone; comparing the count variation with a threshold corresponding to the detection distance; and triggering an operation when the count variation is lower than the first threshold.

This invention relates to the field of fiber optic temperature measurement technology, specifically to a high-temperature sensor based on a torsion-type long-period fiber grating and its fabrication method. The fabrication process includes: fixing an optical fiber to a rotating fixture and rotating it by a preset angle to prepare an optical fiber with a preset torsional stress field; controlling a laser and a displacement platform to alternately perform fixed-point pulse irradiation and step-by-step movement to induce thermal relaxation of the stress field to prepare the grating; collecting transmission spectral data and controlling the processing equipment based on power loss values; and calculating the temperature sensitivity coefficient. In this invention, by pre-setting a torsional stress field and inducing periodic thermal relaxation of stress, dependence on photosensitive doping materials is eliminated, mechanical strength is maintained, and efficient refractive index modulation is achieved, resulting in excellent thermal stability. Combined with real-time spectral acquisition and loss analysis, a closed-loop feedback is constructed to precisely adjust irradiation parameters, improving temperature sensitivity and linearity, and solving the problems of low yield and poor long-term stability associated with traditional processes.

The present application relates to a kind of non-scanning single-photon polarization three-dimensional imaging method, comprising: constructing pulse laser echo photon number calculation model: pulse laser emits laser pulse, after each light pulse is irradiated to target, the photon number of return to single-photon avalanche photodetector each pixel is related to detection distance;Construct single-photon detector signal and noise model: signal photon and background photon are incident on the photosensitive surface of detector to complete photon injection, based on the quantum efficiency of detector, photoelectric conversion is generated echo electron and canister noise electron, noise electron is generated by thermal current, tunneling current, then carries out electric injection, then based on avalanche probability, avalanche multiplication is completed, and finally, the signal is read out through avalanche signal detection;Construct polarization modulation laser radar ranging model, improve target polarization three-dimensional imaging distance.

A system includes an optical path configured to irradiate a part of a target with Stokes light pulses, pump light pulses and hybrid probe light pulses including first probe light pulses and second light pulses, with the first probe light pulses and the second probe light pulses overlapping in time in part, with the first and second probe light pulses partially overlapping with the Stokes pulse and the pump pulse, and with at least one of the first probe light pulses and the second probe light pulses varying phases; and a detector configured to detect CARS spectrum and generated by the Stokes light pulses, the pump light pulses and the hybrid probe light pulses to acquire sets of CARS spectrum in association with the phases of the hybrid probe light pulses.

This invention belongs to the field of semiconductor device technology, specifically relating to a method for fabricating amorphous gallium oxide photoelectric synaptic devices at room temperature and their applications. Amorphous gallium oxide channels are formed on a gate insulating dielectric layer using room temperature sputtering. By controlling the magnetron sputtering power, the amorphous gallium oxide layer is given an oxygen vacancy concentration suitable for generating continuous photoconductivity and synaptic response. The device generates postsynaptic currents under 254nm ultraviolet pulse irradiation, which can be used for simulating ultraviolet irradiation skin damage perception and pain sensitization. It can also convert sound data into cochlear images and further into postsynaptic current characteristics for snoring recognition. This solution combines room temperature fabrication, low power consumption, complete photoelectric synaptic functionality, and information processing capabilities for medical and health monitoring.

The application discloses a Dendrobium candidum multi-index nondestructive quality evaluation method, and belongs to the technical field of traditional Chinese medicinal material nondestructive detection, and particularly relates to a Dendrobium candidum multi-index nondestructive quality evaluation method. The sample is clamped in a measuring cavity, an effective measuring area between nodes is determined, and zero-perturbation pre-scanning data are obtained, based on which a micro-perturbation script is generated, near-infrared pulse irradiation, air heat exchange perturbation and mechanical light tapping perturbation are applied under a unified time axis, diffuse reflection near-infrared spectrum, a thermal recovery curve, a vibration attenuation waveform and an epidermal texture change sequence are synchronously collected, a moisture-polymer coupling state tensor is constructed, and a quality evaluation result or an abnormal label is output.

The application discloses a composite film structure capable of realizing color inkless printing by using ultrafast laser, and a printing method and equipment.The dielectric surface of a metal / dielectric composite film is irradiated by focused ultrafast laser pulses, so that an oxidation reaction is induced on the dielectric film surface to form a transparent oxide film, and finally a three-layer composite film of metal / dielectric / oxide is formed from bottom to top.The thickness of the oxide film at the corresponding position is controlled by changing the total energy density of irradiation, so as to change the color of the composite film surface at the corresponding position.The method for realizing color inkless printing by using ultrafast laser has a resolution of 20000 dpi.The composite film structure can form double-resonance absorption in the visible light band, so that the color gamut formed can cover more than 85% sRGB.The printing method does not involve any organic matter and toxic substances, and is environment-friendly.

The invention provides a defect detection method and system for a steel belt elevator with a machine room based on infrared nondestructive imaging, and relates to the technical field of equipment detection.The infrared thermal image sequence formed after a steel belt is excited by a pulse heat source is obtained through infrared camera devices arranged on the two sides of a traction machine, the pulse heat source is used for performing pulse irradiation on the running steel strip so as to form temperature difference on the surface and the subsurface layer of the steel strip; the infrared thermal image sequence is input into a defect target detection model for processing, a defect positioning result corresponding to the infrared thermal image sequence is output, and the defect target detection model comprises a feature extraction backbone network, a feature fusion neck network and a target detection head which are connected in sequence. According to the invention, the defect detectable rate of the steel belt can be improved.

A quantum gate device includes a qubit substrate that includes at least two data qubits, namely a first data qubit and a second data qubit, and a coupler qubit disposed between the first data qubit and the second data qubit and a pulse irradiator that irradiates drive pulses to the coupler qubit. The pulse irradiator irradiates a first cross-Rabi transition drive pulse and a residual ZZ interaction elimination drive pulse, which is shifted by a predetermined frequency from the first cross-Rabi transition drive pulse. The predetermined frequency shift is a value that eliminates the residual ZZ interaction between the first data qubit and the second data qubit.

The present application relates to the technical field of radar remote sensing monitoring and soil and water conservation, and discloses a basin soil erosion intelligent sensing and early warning system based on space-air-ground cooperation, comprising: a synthetic aperture radar observation platform, a plurality of variable-depth active coherent beacons arranged on the surface of a monitored basin, and a data processing and inversion center; the synthetic aperture radar observation platform is used for constructing an air-ground active observation link of downlink radar pulse irradiation and uplink echo reception; the variable-depth active coherent beacon comprises a deep anchoring unit and a surface floating unit, and is used for capturing a surface vertical displacement difference value and mapping the displacement difference value into a baseband phase modulation amount by using a digital gain coefficient greater than 1. By introducing orthogonal coding modulation technology in the slow time domain and combining a matching projection operator based on a precise orbit state vector, accurate decoupling of the beacon echo under a strong ground clutter background is realized.

The application provides an insulator pollution resistance evaluation method and system, and belongs to the technical field of insulator monitoring of a power system.The method comprises the following steps: using a high-power halogen light source to pulse-irradiate the surface of an insulator; continuously monitoring the surface of the insulator by using a multispectral imaging device; calculating the water content decay rate according to the monitoring data obtained by the multispectral imaging device; grading and evaluating the pollution resistance of the surface of the insulator according to the calculated water content decay rate; and performing pseudo-color processing according to the evaluation result to obtain a visual result of the pollution resistance level of the surface of the insulator.The application can quickly obtain reflectivity data by continuously monitoring the surface of the insulator by using the multispectral imaging technology, and can obtain the water content decay rate by using an accurate calculation method, so that the accurate evaluation of the pollution resistance of the insulator can be realized.

The present application relates to a method and apparatus for measuring the detection efficiency of a single-photon detector, a device, and a medium. The method comprises: acquiring time interval data generated by a single-photon detector under measurement in an event-refreshed time-to-digital converter under the action of each light pulse at the same wavelength, and determining by means of calculation a probability density of the time interval data falling within a statistical bin of a preset statistical histogram, so as to determine a temporal photon probability distribution of said single-photon detector under the irradiation of each light pulse; using a preset photoelectron counting model to fit the temporal photon probability distribution, so as to determine the average number of photoelectrons detected by said single-photon detector under the action of a single light pulse; and determining the detection efficiency of said single-photon detector on the basis of the average number of incident photons and the average number of photoelectrons, so as to complete the measurement of the detection efficiency of the single-photon detector. The present application greatly improves the measurement efficiency, and also significantly improves the measurement accuracy of a detection efficiency spectrum.

An optical fiber processing device (10) is provided with: a roller (11) that has, on the outer periphery thereof, a recess (15) on which an optical fiber (1) is hung; and an irradiation part (12) that irradiates the inner surface (15a) of the recess (15) with a light pulse (16). The inner surface (15a) includes a plurality of reflection surfaces (20) that periodically change the reflectance of the light pulse (16) along the rotation direction of the roller (11), and reflect the light pulse (16) so as to condense the light pulse (16) into the core (2) of the optical fiber (1).

Methods and systems for mitigating the effects of defects in a quantum processor are provided. A mitigation system uses an iterative process of applying light pulses and examining qubit relaxation times to eliminate or minimize two-level system (TLS) interaction with qubits. The system applies a first light pulse to illuminate a quantum processor having one or more qubits. The system receives qubit relaxation times that are measured at different electric field frequencies after applying the first light pulse. The system applies a second light pulse to illuminate the quantum processor upon determining that the received qubit relaxation times indicates presence of a strongly coupled TLS in the quantum processor.

This application relates to high-throughput optical metrology. A method for optically metrologically measuring a sample is provided, the method comprising illuminating a region of the sample with multiple sets of pulses of different wavelengths during variable-speed movement of the sample; collecting light reflected from the sample as a result of the illumination to provide multiple sets of frames, each set of frames comprising multiple partially overlapping frames associated with different wavelengths; and processing these frames to provide an optical metrological result indicating one or more evaluation parameters of elements of the sample region; wherein the processing is based on a mapping between the multiple sets of frames and reference measurements obtained through other optical metrological processes that exhibit a higher spectral resolution than that obtained by illumination and collection.

An apparatus for characterizing sub-micron regions of a sample with an atomic force microscope (AFM) includes a probe of the AFM having a tip that interacts with a sample. A light source is provided to illuminate a tip-sample region with light pulses at least two pulse repetition rates to induce corresponding sample modifications. A detector measures corresponding probe deflection due to the induced sample modifications and generates signals corresponding to the light induced probe deflection changes. The AFM includes at least one controller, the controller extracting at least two sample responses to the light pulses from the measured probe deflection. And from the at least two sample responses, the system deduces a light induced surface pulse force that is substantially independent of damping.

The invention relates to the technical field of electric power systems, and discloses an HEMP irradiation near-earth cable coupling characteristic analysis method, system, device, medium and product, and the method comprises the steps: constructing a near-earth cable simulation model and an initial ground simulation model in an electromagnetic simulation environment, dividing a ground region in the initial ground simulation model into a plurality of sub-regions, and carrying out the analysis of the coupling characteristics of a near-earth cable in the electromagnetic simulation environment; carrying out smoothing processing on dielectric constants and conductivity of each sub-region, eliminating parameter mutation, carrying out fusion processing on the near-earth cable simulation model and the ground simulation model to form a near-earth cable-ground simulation scene model, and carrying out irradiation simulation calculation on the near-earth cable-ground simulation scene model by taking an HEMP pulse as an excitation source to obtain a near-earth cable-ground simulation scene model. And the coupling characteristic parameters of the target near-earth cable under the HEMP pulse irradiation are obtained, so that the precision and reliability of near-earth cable coupling characteristic calculation are remarkably improved.

A method for the computer-aided provision of control instructions for pulsed irradiation in the additive production of a component structure includes establishing process parameters, including a pulse frequency, a pulse width, a scan speed, and an irradiation power; defining the pulse frequency and scan speed as process constants; and determining parameter values of the pulse width and of the irradiation power from the process constants which have been defined. A corresponding computer program product, a method for bed-based additive production, and a corresponding control device are adapted for pulsed irradiation in the additive production of a component structure.

An optical fiber processing device (10) is provided with: a roller (11) that has, on the outer periphery thereof, a recess (15) on which an optical fiber (1) is hung; and an irradiation part (12) that irradiates the optical fiber (1), while hanging on the recess (15), with an optical pulse (16). The optical axis (16a) of the optical pulse (16) intersects the deepest section (19) of the recess (15).

Embodiments of the present disclosure relate to an apparatus comprising an image sensor. In one embodiment, an apparatus comprises: a scanning image sensor configured to acquire, according to an integration time of the sensor, an image of a scene illuminated by light pulses emitted periodically by a source, such that when the integration time of the sensor is different from the period of the light pulses, the image has regularly consecutive bands containing different luminances; a processor configured to generate a feature vector representative of the regularly consecutive bands with different luminances present in the image acquired by the image sensor, wherein the feature vector is independent of the reflectance of the objects of the scene and the level of light in the scene. The frequency of the bands in the image is determined based on the generated feature vector, and the period of the pulses of the source is determined based on the determined frequency of the bands in the image, and a controller configured to adjust the integration time of the image sensor such that the integration time is a multiple of the determined period of the light pulses of the source.