A transmission electron microscope measurement support grid based on phase change materials

A phase change material and electrical technology, applied in measurement devices, analytical materials, material analysis using wave/particle radiation, etc. The electrode position cannot be changed, and the direct measurement is difficult to achieve the effect of selective measurement, reliable performance and simple structure.
CN101217097AInactive Publication Date: 2008-07-09BEIJING UNIV OF TECH
0 Cites 12 Cited by

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
BEIJING UNIV OF TECH
Publication Date
2008-07-09
Estimated Expiration
Not applicable Β· inactive patent

Smart Images

  • Figure 1
    Figure 1
Patent Text Reader

Abstract

The invention relates to a transmission electron microscope sample loading net, which pertains to the measurement field of nano-materials. The invention includes a support part and a circuit part, the support part includes a metal ring (1), the circuit part includes two electrodes (2), an element which is ready to be measured and a phase change material amorphous thin film (5), the electrodes (2) are insulatedly bonded with the metal ring (1), the phase change material amorphous thin film (5) is evenly distributed between the two electrodes (2), the phase change material thin film (5) is amorphous, the element which is ready to be measured is positioned in the phase change material amorphous thin film (5) or is integrated on one electrode (2). The connection lines in the invention are characterized by erasable property, the higher voltage is added on the both ends of the electrodes, or the loading net is directly done with certain laser pulse irradiation, so the phase change material thin film is completely amorphous, the formed current path disappears, the optional and repeated erasable properties of the measurement circuit are realized.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to a transmission electron microscope sample carrying net, which belongs to the field of nanometer material measurement. Background technique

[0002] Transmission electron microscope (hereinafter referred to as transmission electron microscope or electron microscope) is a modern large-scale instrument and a powerful tool for studying the microstructure of matter. It has a wide range of applications in physics, chemistry, material science, life science and other fields, especially the rapidly developing In the field of nano science and technology, it is one of the most powerful research tools. At present, the resolution of the transmission electron microscope has reached 0.2nm, which is close to the atomic distance of solid matter. With the development of microelectromechanical systems (MEMS, micro electromechanical system) and nanoelectromechanical systems (NEMS, nanoelectromechanical system), it is particularly urgent to study t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More