Abnormal measurement recognition control method, computer equipment and storage medium
A control method and abnormal identification technology, which is applied in the direction of manufacturing computing systems, televisions, electrical components, etc., can solve the problems that affect the normal production of cameras and easy loose substrates, and achieve the effect of ensuring normal detection and production
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[0045] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0046] It can be understood that, in the prior art, the consistency detection in the camera production is usually based on the standard camera to manually manufacture the substrate of the standard camera center. Since there are many types of substrates and the substrate is easy to loosen, the consistency detection in the camera center is caused. During the process, a normal camera may be judged as a camera with abnormal measurement, which will affect the normal production of the camera.
[0047] In order to solve the above problems, the embodiment of the present invention generates and sto...
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